CRAIC Technologies introduces Spectral Surface Mapping software. This gives a user the ability to map the UV-visible-NIR absorbance, reflectance or fluorescence spectral response, point-by-point, with microscopic spatial resolution.
Oxford Instruments Asylum Research announces the new MFP-3D Infinity Atomic Force Microscope (AFM). The MFP-3D Infinity is the new flagship of the Asylum Research MFP-3D AFM family with dramatic performance improvements, new nanomechanical measurement capabilities, and new features that make it simple to get started with tapping mode imaging.
CurTran LLC announced that it has signed its first contract for LiteWire products with Weatherford International Ltd. Per the agreement, Weatherford will use, sell, and distribute LiteWire, the first commercial scale production of a carbon nanotube technology in wire and cable form.
Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, introduces the Automatic Defect Review (ADR)AFM for 300mm bare wafers, a fully automated AFM solution that improves throughput of AFM defect review by up to 1,000%. The 300mm bare wafer ADR AFM is a new process for identifying defects designed specifically for the semiconductor market without the need of reference markers.
CVD Equipment Corporation announces today that its CVD Materials Corporation subsidiary is accepting orders for 300 mm size CVD Graphene grown on Cu foil using its patent pending high quality, low cost CVD graphene process technology.
Microfluidic products expert Dolomite has launched Mitos Dropix, an ingenious droplet-on-demand system capable of easily generating extremely miniaturised droplet compartments with exceptional control over volume, environment and isolation of contents.
With the SkyScan 2211, for the first time one single instrument is capable of non-destructive scanning and 3D reconstruction of internal microstructures of large objects, as well as providing submicron resolution for small samples.