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Helic EDA Solutions in TSMC RF Reference Design Kit 3.0

Helic Inc., the technology leader in synthesis and verification solutions for RF and high-speed IC design, today announced the TSMC RF Reference Design Kit 3.0 (RF RDK) incorporates its EDA products for EM modeling and RF substrate noise coupling analysis.

Posted: Jun 1st, 2011

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New JEOL Stage Navigation System for SEM and EPMA

JEOL offers a new point-and-shoot navigation system that makes finding precise locations on a sample both fast and easy for SEM and EPMA users. The Stage Navigation System combines Stage Navigation Software with an externally-mounted 3 Megapixel CMOS color digital Stage Navigation Camera that functions as a low magnification optical microscope. The external camera eliminates the need for a dedicated port on the electron column.

Posted: May 31st, 2011

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NanoWorld AG Launches High Speed Scanning AFM Website

NanoWorld AG announced that it has launched a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM). NanoWorld dedicates this website to the community of high speed scanning AFM users and focuses on the probe aspect of high speed scanning.

Posted: May 30th, 2011

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BASF Entering Into Electrolyte Activities

BASF is entering the business of electrolytes for lithium-ion batteries (LIB) and is forming a global electrolytes team in its Intermediates division for this purpose. By adding electrolytes to its existing portfolio for the LIB industry, BASF is able to offer another key component for the battery technology.

Posted: May 30th, 2011

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Bruker Launches Novel D8 QUEST and D8 VENTURE High Performance X-ray Crystallography Systems with Next-Generation Large Area CMOS Detectors

This Memorial Day weekend at the 2011 Annual ACA Meeting, Bruker will launch a new series of high-performance X-ray crystallography systems, including the D8 QUEST and the D8 VENTURE. Both systems incorporate next-generation X-ray source and novel detector technology to deliver unrivalled performance, ease of use, reliability and value.

Posted: May 27th, 2011

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PearL: Advanced In-line Photoluminescence Analysis

PearL is part of the LayTec product line for solar applications. It is an optical in-line monitoring system, measuring photoluminescence spectra of thin-film modules in production lines. The system is designed for measuring in CIGS based production lines.

Posted: May 27th, 2011

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