Applied Nanotech Holdings, Inc. and NanoHolding Inc., the parent company of Nanofilm, Ltd. (Nanofilm), a private company with a leading market position for specialty optical coatings, cleaners and nano-composite products, today jointly announced that their respective Boards of Directors have approved an agreement and plan of merger and exchange. Under terms of the agreement, a new company named PEN Inc (PEN) will be created.
For the German companies dealing with microtechnology, nanotechnology, advanced materials and optical technologies, business in 2013 has developed just as the industry had predicted earlier that year: at a constant level. But things are supposed to get better in 2014.
A key 3M patent for lithium ion battery nickel-manganese-cobalt (NMC) cathode technology has emerged from reexamination at the U.S. Patent and Trademark Office (USPTO) with all original claims being confirmed as patentable and with no amendments (U.S. Patent 7,078,128).
JEOL USA has launched an imaging contest to showcase some of the best work of users of its electron microscopes. A winning image will be selected for each month of 2014, judged by JEOL's SEM and TEM applications teams for their technical and artistic qualities.
NanoHybrids Corporation, a provider of nanotechnology-based contrast agents announced the launch of its new website and premium product line of gold nanoparticles specially designed to improve imaging results.
Asylum Research, an Oxford Instruments company, invites all Cypher and MFP-3D AFM users to enter their best AFM data, including images, force curves, or videos, in the Asylum Research Image Contest. Each scientist will receive an Asylum gift pack just for sending in their images. An Apple iPad will be awarded at the close of each quarter to the winning image that best represents excellence in science and the 'cool' factor as judged by our team of applications scientists.
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announces their first AFM image contest winner, Namuna Panday, a Graduate Student at Florida International University. Her winning submission is an AFM image taken using Park XE Bio of a HeLa Cell used in her research studying drug delivery methods for cancer research.
Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolution for failure analysis in the semiconductor industry. The newly designed and innovative Park Systems PinPoint iAFM effectively solves the issues of traditional AFM thereby providing the most optimum solution to the FA engineers' needs available in the nanotechnology industry today.
Piezo Nanopositioning Systems specialist PI (Physik Instrumente) has introduced a new piezo-Z nanopositioning system for imaging and fast focusing applications. It consists of large aperture piezo stage and a digital controller.