Excelitas' newest UV-enhanced SPCM, with peak sensitivity in the 400-500 nm range, is ideal for fluorescence detection, confocal microscopy, single molecule detection, and other photon counting applications.
Industrial Nanotech, Inc. today announced that the Company is starting multiple pilot projects with hospitals and universities throughout the U.S. to increase the efficiency of their steam processes through use of the Company's patented Nansulate thermal insulation and corrosion prevention coatings.
KLA-Tencor Corporation, the world's leading supplier of process control and yield management solutions for the semiconductor and related industries, introduced the newest addition to its Component Inspector series, the ICOS CI-T620 - a high-performance component inspector system for tape and reel.
The IonFlux system will enable detailed studies of nanoparticle membrane disruption, a novel application for automated patch clamp instruments that are typically used for the characterization of ion channel modulators.
Camtek Ltd. announced today that a leading Asian Semiconductor Manufacturer has selected the Xact, Camtek's Advanced TEM (Transmission Electron Microscope) sample preparation solution, enabling material analysis and verification.
Thermo Fisher Scientific Inc. today announced the release of the Thermo Scientific EASY-Column for nanoscale HPLC applications. Nanoscale HPLC is primarily used in combination with high performance mass spectrometry for the analysis of complex biological samples, such as applications in proteomics and disease biomarker discovery.
NanoSight, world-leading manufacturers of unique nanoparticle characterization technology announce the release of Zeta Potential Analysis applying Z-NTA, particle by particle characterization of surface charge.
Cadence Design Systems, Inc., a leader in global electronic design innovation, today announced major enhancements to its Virtuoso-based custom/analog flow, boosting productivity across the entire flow from initial design specification to final GDSII and for process nodes down to 20 nanometers.
At Pittcon 2011, Bruker is announcing its latest product innovations and is showcasing its expanding portfolio of analytical technologies. The new systems deliver more sensitivity, productivity and specificity for confident analysis in industrial and applied markets, and open new horizons for advanced molecular and materials research applications.
The Model 1120 represents a breakthrough in signal measurement with 1pS resolution on a single-shot. For repetitive waveforms, the jitter is typically 10 ps. The start and stop inputs allow for a wide dynamic threshold range and as well as slope select.
RUSNANO, Micran, Nokia Siemens Networks, and the Tomsk Oblast Administration signed a letter of intent today for production of fourth-generation LTE telecommunications equipment. The hardware will be produced in the Tomsk Special Economic Zone.
Plasma-Therm LLC, a leading supplier of plasma etch and deposition equipment, has announced it has secured majority shareholder status of Advanced Vacuum, a leading vacuum and thin film equipment provider headquartered in Sweden.
Picosun Oy, Finland-based global manufacturer of state-of-the-art Atomic Layer Deposition (ALD) systems has launched production of fully automated high volume throughput batch reactors for crystalline silicon (c-Si) solar cell surface passivation.
Carl Zeiss, a leading provider of microscopy solutions, announces that it will be exhibiting a range of high performance optical and electron microscopy products at the Pittcon Conference and Expo 2011, March 13-18, 2011 at the Georgia World Congress Center, in Atlanta, Georgia.