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Park NX-Wafer for Wafer-Fab Manufacturing Fully Automates Semiconductor Industry's Bare Wafer Automated Defect Review Process, Increases Throughput by 1,000 Percent

Park NX-Wafer produces sub-Angstrom roughness measurements for the flattest substrates and wafers with tip-to-tip variation of less than 2%, for the first time ever in the entire history of the semiconductor industry. This fully automated defect review and identification system enables a critical inline process to classify defect types and source their origin through high resolution 3D imaging only available at Park Systems, the world's leading AFM provider.

Posted: Jul 14th, 2014

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Vorbeck, In-Q-Tel Partner To Develop Conductive Graphene Compounds

Vorbeck Materials Corp., a world leader in the field of graphene, has entered into a strategic investment and technology development agreement with In-Q-Tel, Inc., the independent strategic investment firm that identifies innovative technology solutions to support the missions of the U.S. Intelligence Community.

Posted: Jul 2nd, 2014

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