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Carl Zeiss Launches New Photomask Registration System

Carl Zeiss introduces its PROVE Registration and Overlay Metrology System for photomasks at SPIE Photomask Conference in Monterey, CA. PROVE measures image placement on photomasks with superior resolution meeting the challenging requirements of the 32nm technology node and beyond.

Posted: Sep 13th, 2010

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GE Healthcare Showcases Molecular Imaging Tools that Give Researchers Insight into Origins of Disease

Reinforcing its commitment to researchers and clinicians, GE Healthcare, a unit of General Electric Company is showcasing a comprehensive molecular imaging portfolio - encompassing tracer development, pre-clinical imaging and highly advanced imaging equipment - to provide insight into the origins of disease, at the World Molecular Imaging Congress (WMIC), Booth #212, September 8 through 11 in Kyoto, Japan.

Posted: Sep 9th, 2010

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Kopin Announces Phase II Award to Develop Advanced Nitride Electronic Materials

Kopin Corporation, the world's leading producer of heterojunction bipolar transistor wafers for smart phones and other mobile devices, announced today that it has received a two-year, Phase II Small Business Innovative Research (SBIR) contract for the development of Aluminum Indium Nitride-based high electron mobility transistors.

Posted: Sep 9th, 2010

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