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Veeco Introduces Precision Optical Profiler for Automated HB-LED Production QA/QC

At the SEMICON West trade shows and seminars in San Francisco this week, Veeco Instruments Inc., a leading global provider of precision instrumentation and metrology solutions for scientific and industrial markets, will announce a new ContourGT Optical Surface Profiler configuration optimized for characterizing high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS).

Posted: Jul 12th, 2010

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Applied Materials Celebrates 20-Year Success of Endura System with New Innovations for Cutting-Edge Chip Designs

Applied Materials, Inc. today celebrates the 20th year of its Applied Endura platform, the most successful metallization system in the history of the semiconductor industry. Endura systems revolutionized semiconductor metallization by delivering breakthrough technologies and levels of reliability, serviceability and flexibility that far surpassed existing capabilities.

Posted: Jul 12th, 2010

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SurModics Showcases Drug Delivery Technology

SurModics, Inc., a leading provider of drug delivery and surface modification technologies to the healthcare industry, is participating at the 37th Annual Meeting and Exposition of the Controlled Release Society (CRS), July 10-14, 2010 in Portland, Oregon. SurModics announced that it is presenting four scientific posters on its drug delivery technologies.

Posted: Jul 12th, 2010

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Metryx Sees Increased Adoption of Mass Metrology for 300 mm

Metryx, Limited, announced that over the past six months it has seen a sharp recovery in business, with multiple Mentor mass metrology system orders received, including both new and repeat business. These orders represent customers who are expanding the use of Metryx' mass metrology systems in their production lines and initial implementations of the technology in new applications.

Posted: Jul 12th, 2010

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