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Olympus Features New Wafer Handler And All-in-one Microscope

Olympus will be exhibiting two exciting new products designed for research, design and quality assurance applications in the microelectronics and solar industries at the SEMICON West and Intersolar North America exhibitions, being held concurrently at the Moscone Center in San Francisco from July 13-15.

Posted: Jul 12th, 2010

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Veeco Introduces Precision Optical Profiler for Automated HB-LED Production QA/QC

At the SEMICON West trade shows and seminars in San Francisco this week, Veeco Instruments Inc., a leading global provider of precision instrumentation and metrology solutions for scientific and industrial markets, will announce a new ContourGT Optical Surface Profiler configuration optimized for characterizing high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS).

Posted: Jul 12th, 2010

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Applied Materials Celebrates 20-Year Success of Endura System with New Innovations for Cutting-Edge Chip Designs

Applied Materials, Inc. today celebrates the 20th year of its Applied Endura platform, the most successful metallization system in the history of the semiconductor industry. Endura systems revolutionized semiconductor metallization by delivering breakthrough technologies and levels of reliability, serviceability and flexibility that far surpassed existing capabilities.

Posted: Jul 12th, 2010

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