Engineers and scientists working in the fields of nano-biotechnology, metrology, and photonics run applications that require nanometer precision and ultra-fine adjustment, often in confined spaces. To meet those requirements, PI provides its compact linear piezo positioners - P-620.1 to P-629.1 - of the PIHera family consisting of 60 stages available in a large variety of travel ranges.
Park Systems announces the 2017 Park AFM Scholarship Award eligible to undergraduate or postdoctoral students working in nanotechnology research either already using Park AFM or who have research they would like to do with Atomic Force Microscope and need help getting access to the equipment.
Higher scanning speed, ceramic-insulated acutators for long life, flexures for friction-free motion, and capactive sensors for sub-nm precise positioning make this new piezo nanopositioner ideal for fast fiber alignment and microscopy applications.
With AFSEM the gradual increase of conductivity can be studied directly between the irradiation steps, without sample transfer. Since the measurements are performed in the vacuum of the SEM, contamination issues that are generally encountered in air are reduced.
Affordable system with a new all-digital servo controller and auto-calibration chip, long-life PICMA piezo drives comes in 6 different variations optimized for travel range, speed, linearity, and stability.
Fast response, high bandwidth and force, and virtually unlimited resolution make piezoelectric transducers invaluable to modern high tech applications including flow measurement, distance gauging, bio-medical dispensing and aerosol generation, as well as metrology, semiconductor testing, and aerospace technology.
PI has released a low-profile motorized positioning stage with a very small footprint of 60x86mm and a travel range of 25mm, best suiting it for research and industrial applications including fiber alignment, metrology, quality assurance testing, photonics packaging, test equipment, and micromachining.
Park Systems, world leading manufacturer of Atomic Force Microscopes (AFM) today announced Park NX20 300mm, the first and only research AFM on the market capable of scanning the entire sample area of 300 mm wafers using a 300 mm vacuum chuck while keeping the system noise level below 0.5angstrom RMS.