Bruker Corporation today announced that it has launched the ContourSP large panel metrology system, which more than doubles the measurement throughput of the high-density interconnect substrates in multi-chip modules over previous generation SP models used by the semiconductor packaging industry.
Boston-area company Bandgap Engineering, Inc., announced it has increased the average efficiency of standard, commercial solar cells by 0.4 percentage points, from 17.2% to 17.6%, just by replacing the standard surface texture with its nanowire technology.
Nanobiotix, a clinical-stage nanomedicine company pioneering novel approaches for the local treatment of cancer, announces today, in accordance with its plans, the selection of its new product, NBTX-TOPO, in view of its preclinical development.
Graphenea is a start-up company which has developed innovative technology for the production of high-quality graphene and whose products are supplied to 40 countries and to multinationals such as Nokia, Philips and Sigma-Aldrich, amongst others.
Applied Nanotech Holdings, Inc. has received a contract from NYSEARCH - Northeast Gas Association (NGA), worth more than $500,000, to fund prototype development of a small, reliable, low-cost methane (natural gas) sensor for residential and industrial applications.
Applied DNA Sciences, a provider of DNA-based anti-counterfeiting technology and product authentication solutions, today announced the signing of three new customers who will be using SigNature DNA to mark electronics supplied to the US Defense Logistics Agency.
Agilent Technologies Inc. announced the availability of its 7500 atomic force microscope (AFM), a highly advanced instrument that establishes new performance, functionality and ease-of-use benchmarks for nanoscale measurement, characterization and manipulation. The Agilent 7500 achieves atomic resolution imaging with its 90 m AFM closed-loop scanner.
Park Systems introduces QuickStep SCM, the newest technology for high throughput in scanning capacitance microscopy (SCM). Designed to work with Park NX AFM series, the leading AFM products for researchers and engineers in the semiconductor industry, Park's QuickStep SCM provides accurate dopant profiles of semiconductor device structures, 5 to 10 times faster than any other competing SCM atomic force microscopy systems.