At the International Conference on Nitride Semiconductors (ICNS) in Korea on 18-23 October LayTec presented its latest product: Pyro 400. Unlike conventional infrared pyrometry, which can only detect the susceptor surface temperature under sapphire or SiC wafers, Pyro 400 is the first real solution for measuring the exact surface temperature of GaN layers.
WaferGen Biosystems, Inc., a leading developer of state-of-the-art genetic analysis systems, today announced that the University of Texas Southwestern Medical Center demonstrated the utility of WaferGen's new proprietary SmartChip Nano-dispenser.
SEMATECH engineers and the industry at large continue to make progress in developing the infrastructure that will enable lithography for cost-effective manufacturing, according to papers presented at the 2009 International EUVL (Extreme Ultraviolet Lithography) and 193 nm Immersion Extensions Symposia, held Oct. 18-23, in Prague, Czech Republic.
Arrowhead Research Corporation announced today that its majority owned subsidiary, Unidym, Inc., has entered into a joint development agreement with Samsung Electronics Co., Ltd., a leading maker of liquid crystal display (LCD) panels, to extend their successful collaboration into a third year.
DCG Systems, Inc. today announced major additions to its comprehensive range of integrated diagnostic tools designed to meet the complex challenges facing manufacturers of today's advanced 32 nm device technologies.
This fully integrated surface characterization tool is designed to meet the demands of surface engineers whether working in cutting-edge research and development of new surface chemistries or dealing with routine characterization of surfaces, thin films and coatings.
The goal of Photonion is to develop new analytical devices based on the mass spectroscopic method invented at Helmholtz Zentrum München in order to be able to directly analyze complex organic gases, liquids or solid materials.
JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is happy to announce the latest member of their nanotechnology characterization systems family: the ForceRobot300, the new standard in single molecule force spectroscopy.
Rudolph Technologies, Inc., a worldwide leader in process characterization solutions for the semiconductor manufacturing industry, announced today that Touch Micro-System Tech, a major manufacturer of micro-electro-mechanical systems (MEMS) located in Taiwan, has reported a substantial reduction in per-wafer inspection time using Rudolph's NSX Inspection System and Discover Data Analysis software.
Diamon-Fusion International, Inc., global developer and exclusive licensor of patented hydrophobic nanotechnologies, announced today the signing of another key strategic alliance and license agreement in Hong Kong with Decorlinks Ltd.