Park Systems, a leading manufacturer of Atomic Force Microscopy systems since 1997 announced PinPoint Conductive AFM, an extremely accurate conductive measurement technology at nano-scale resolutionfor failure analysis (FA) in the semiconductor industry.
NanoSight Ltd, an innovative nanoparticle characterization company has been acquired by a leading global provider of instrumentation and expertise for materials and biophysical characterization, Malvern Instruments Ltd. The acquisition was completed on Friday 27th September.
This week, the representatives of Czech nanotechnology firms, two famous technical universities and CzechInvest took part in a technology mission to China, where they met Chinese counterparts and discussed the further strengthening of cooperation in the field of nanotechnology.
ZEISS is introducing a new X-ray microscopy (XRM) solution that increases throughput for three-dimensional imaging at the nanoscale by up to 10 times. Using a series of technical innovations to achieve better contrast, and in turn faster acquisition, the new ZEISS Xradia 810 Ultra revolutionizes the X-ray imaging model in scientific and industrial research labs worldwide.
This acquisition complements the Air Liquide ALOHA product line of advanced precursors, and brings together synergies in molecule discovery and scale up, contributing to accelerate the introduction of a broader portfolio of new high-tech materials to semiconductor manufacturers and therefore enabling the increase in computing power and connectivity.
The company will present recent results using APDN's highly cost-effective and proven way to authenticate originality and verify provenance of fibers, yarn, fabric, garments and labels. Items are marked with a unique, secure and enduring botanically-derived DNA signature that can be definitively authenticated at any point in the supply chain.
SEMATECH, a global consortium of semiconductor manufacturers, has released the results from its annual mask survey, which provides a comprehensive look into both the business and technical aspects of the mask industry.
The Hiden EQS-series of quadrupole mass spectrometer probes were introduced for measurement of external ions in a vacuum environment, specifically for application to the SIMS surface analysis technique.
Applied Materials, Inc. and Tokyo Electron Limited today announced a definitive agreement to create a global innovator in semiconductor and display manufacturing technology via an all-stock combination which values the new combined company at approximately $29 billion.
Further demonstrating dedication to developing new materials, concepts, process steps for the sub-10nm node, imec and Micron today announced they have extended their strategic research collaboration on advanced CMOS scaling and other joint research efforts for another three years.