The University of Pennsylvania has selected the architectural design firm Weiss/Manfredi along with M+W Zander, an engineering and construction firm that specializes in projects with a scientific focus, to design the Krishna P. Singh Center for Nanotechnology.
Konarka Technologies, Inc., an innovator in development and commercialization of Power Plastic, a material that converts light to energy, today announced the company successfully conducted the first-ever demonstration of manufacturing solar cells by highly efficient inkjet printing.
Fujifilm Life Science, a leading provider of scientific imaging systems, today introduced FLA-9000, the first modular image scanner capable of unparalleled proteomic applications in radioisotopic, fluorescent, chemiluminescent, and digitized imaging.
Over NT$300 billion (US$9.68 billion) in nanotechnology production value has been amassed by Taiwan's manufacturers in the last five years, thanks to a six-year developing program that combines efforts from academia and industry, a Council for Economic Planning and Development (CEPD) official said Sunday.
Agilent Technologies Inc. today announced it has signed an agreement to acquire TILL Photonics GmbH and has completed the acquisition of Colloidal Dynamics. Both companies will join the recently created Materials Science Solutions Unit within Agilent's Life Science and Chemical Analysis business. Financial details were not disclosed.
FEI Company and Malvern Instruments Ltd. have released Quanta Morphologi, a powerful new solution combining the performance of FEI's Quanta FEG scanning electron microscope and Malvern's proven Morphologi particle characterization software. For the first time ever, Quanta Morphologi users, including pharmaceutical quality control method development labs, will have direct analysis methods to obtain both size and shape information on sub-micron particles.
Fujitsu Laboratories Ltd. today announced the successful formation of a new nano-scale carbon composite featuring a self-organizing structure, by combining carbon nanotubes and graphene which are both nano-scale carbon structures.
The Intel Atom processor will be the name for a new family of low-power processors designed specifically for mobile Internet devices and a new class of simple and affordable Internet-centric computers arriving later this year.
According to Nanovere Technologies Chairman and Principal Scientist Thomas F. Choate, 'What’s most unique about Zyvere coatings based on nanotechnology; is their ability to resist scratching and ease of cleaning. Zyvere Nanocoatings are permanent, self-cleaning and car key resistant.'
Despite uncertainty over the nuclear deal, India and the US Friday agreed on 'a series of time-bound actions' that will bring the level of their high technology trade in tune with their growing strategic partnership.
The world's biggest nanotechnology event saw Nanoco unveil a solid state lighting device based on its cadmium free quantum dots CFQDTM and also showcase latest developments in the area of CIGS nano particles.
Metryx, Limited, a supplier of mass metrology equipment to the semiconductor manufacturing industry, today announced that it will be hosting the first technical seminar focused on the implementation of mass metrology in the production of advanced semiconductor devices. The one-day seminar will be hosted at IMEC's facilities in Leuven, Belgium, on April 8th, 2008.
Altair Nanotechnologies Inc., a leading provider of advanced nanomaterials technology for use in energy, life sciences and industrial applications, today announced that Alan Gotcher, Ph.D., has agreed to resign as an officer of the company and that the Board of Directors has begun a search for a new Chief Executive Officer. The Board has appointed Terry Copeland, Ph.D., to serve as interim President.
Applied Materials concurrently held its 12th Annual Technology Forum with this week’s SPIE Advanced Lithography Conference in San Jose. Having 'Reality Takes Shape: Patterning at 32 nm' as its theme, the wide-ranging event covered a number of subjects, not the least of which were the challenges faced by metrology.