Applied Materials, Inc. today unveiled its most advanced defect review SEM, the Applied SEMVision G4, which extends the technology and productivity of Applied’s highly successful SEMVision system to 45 nm and beyond applications.
Veeco Instruments Inc. announced the introduction of its new InSight 3D Automated Atomic Force Microscope Platform, the only metrology system available with the accuracy and precision required for non-destructive, high resolution three-dimensional measurements of critical 45nm and 32nm semiconductor features, with the speed to qualify as a true fab tool.
Xidex Corporation, an Austin-based nanotechnology company, has been awarded a new contract from the Department of Energy for scaleable manufacturing of carbon nanotube based field emission sources for use in scanning electron beam instruments such as scanning electron microscopes and transmission electron microscopes.
Nanogen, Inc. announced that on November 27, 2007 it received a letter from the Nasdaq Stock Market advising that for 30 consecutive business days preceding the date of the letter, the bid price of the company's common stock had closed below the $1.00 per share minimum bid price required for continued inclusion on the Nasdaq Global Market.
Morph Technologies Inc., an industry leader in the development and supply of advanced nanotechnology-enabled components for the automotive sector, announced today that it had received an equity investment from DuPont Engineering Polymers.
Titan Global Holdings, Inc. has announced that Titan Nexus, Inc., a unit of Titan Electronics Group, has successfully completed the final step in the acquisition of the assets of Nexus Nano Electronics, Inc.