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Interlayer Detector For Ion Beam Milling Processes

The Hiden IMP-EPD end point detector system directly monitors the surface ions generated in the etching process, identifying the species present, their relative abundances and precisely defining the interlayer boundary to just 2.5 Angstrom. Species with molecular weights up to 300amu are determined.

Posted: May 14th, 2014

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Two New Piezo Nanopositioning Stages From nPoint

The NPXY60-258 and the NPXY60Z20-257 piezo stages are the latest additions to nPoint's nanopositioning lineup. These stages are designed for advanced research markets in need of UHV and non-magnetic positioning.

Posted: May 14th, 2014

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