Nanotechnology News – Latest Headlines

First discovery of a natural topological insulator

In a step toward understanding and exploiting an exotic form of matter that has been sparking excitement for potential applications in a new genre of supercomputers, scientists are reporting the first identification of a naturally occurring topological insulator.

Mar 6th, 2013

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Key EUV milestone, DSA progress, more reported at SPIE Advanced Lithography

Significant progress in EUV lithography as well as demonstrations of DSA advancements were among highlights at SPIE Advanced Lithography, the industry's leading annual forum on state-of-the-art lithographic tools, resists, metrology, materials characterization, and design and process integration. Researchers and developers from around the world met in San Jose, California, to report on advances in chip-making technologies that enable computers, smartphones, and other vital applications.

Mar 6th, 2013

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Nanoelectronics conference will focus on semiconductor industry's future

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, to be held at the National Institute of Standards and Technology (NIST), March 25-28, 2013.

Mar 5th, 2013

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Nanoclusters in steel add strength, stability under irradiated conditions

In this study, scientists used various analysis tools, including EMSL's atom probe tomography (APT), focused ion beam, and accelerator capabilities, to examine complex oxide nanoclusters within oxide dispersion strengthened, or ODS, steels to determine their potential resistance and stability under a range of irradiation conditions.

Mar 5th, 2013

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