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Bruker AXS Microanalysis, headquartered in Berlin, Germany and Ewing, NJ, USA, is a worldwide leading manufacturer of systems for energy-dispersive X-ray nano-analysis in materials research and testing.

As a research-focused company, we invest in the development of innovative products to satisfy the needs of our markets and to give our clients the opportunity to perform their work using the most modern equipment available. Our instruments are applied in a wide range of industries, including chemistry, pharmaceuticals, semiconductor, life science, nanotechnology and research and education. Our product lines comprise:

• QUANTAX spectrometers for microanalysis on scanning and transmission electron microscopes (EDS),

• The S2 PICOFOX spectrometer for total reflection X-ray fluorescence elemental analysis(TXRF),

• ARTAX spectrometers for in-situ micro X-ray fluorescence elemental analysis (µXRF) and

• The D2 CRYSO single crystal orientation analyzer, based on X-ray diffraction technology (XRD).

All our products feature the XFlash® Silicon Drift Detector (SDD) technology, for X-ray detection. We are the technological market leader with over 10 years experience in this detection method for materials analysis. Our SDDs require only moderate cooling, which can be accomplished with a passive thermoelectric cooling system. As a result, our systems do not require any consumables and do not interfere with others, e.g. they do not cause vibration on sensitive electron microscopes. This also allows us to design very compact and light-weight devices that can be applied in areas, which are barred to others because of their size or use of hazardous cooling media.

Bruker Showroom
Articles		Downloads
•	Bruker meets the challenges of nanoanalysis. Bruker AXS Microanalysis is proud to present solutions for its QUANTAX microanalysis systems that allow the SEM analyst to obtain elemental information on the nanometer scale.		QUANTAX (564 KB) X-ray microanalysis is an analytical technique for determination of the chemical composition of solid samples, thin layers or particles in electron microscopes. Using our QUANTAX ED energy dispersive X-ray spectrometry system (EDS) it is possible to detect and analyze all elements from beryllium to americium simultaneously. Obtaining elemental information from a sample volume of only a few microns – or even naometers – and providing relative detection limits in the order of a tenth of mass percent makes X-ray microanalysis one of the most sensitive analysis methods available. The QUANTAX ED family of EDS systems offered by Bruker AXS Microanalysis delivers reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use. Bruker's unique, liquid nitrogen free XFlash® silicon drift detectors (SDD) together with the state-of-the-art hybrid pulse processor technology deliver both the highest possible energy resolution and over ten times the speed of conventional Si(Li) based systems.


			XFlash 5030 (156 KB) The XFlash® 5030 Detector for our QUANTAX ED microanalysis system comes with an active area of 30mm² and an improved electron trap that causes no interference at low microscope acceleration voltages. The detector is available with an excellent energy resolution of down to 127 eV at Mn-Ka and 100,000 cps at the input. These properties make this detector the instrument of choice for low beam current / count rate conditions like found in cold-cathode field emission SEMs, environmental SEMs or TEMs. Nevertheless, the XFlash® 5030 can also easily cope with high input count rates up to 750,000 cps.


Videos/Images/Podcasts		Products
		•	QUANTAX
		•	XFlash® 5010 Detector
		•	XFlash® 5030 Detector
		•	XFlash® QUAD 5040 Detector
Case Study		Other

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