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Bruker meets the challenges of nanoanalysis. Bruker AXS Microanalysis is proud to present solutions for its QUANTAX microanalysis systems that allow the SEM analyst to obtain elemental information on the nanometer scale.

QUANTAX (564 KB)

X-ray micro and nanoanalysis is an analytical technique for determination of the chemical composition of solid samples, thin layers or particles in electron microscopes. Using our QUANTAX energy dispersive X-ray spectrometry system (EDS) it is possible to detect and analyze all elements from beryllium to americium simultaneously. Obtaining elemental information from a sample volume of only a few cubic microns – or even nanometers – and providing relative detection limits in the order of a tenth of a mass percent makes X-ray microanalysis one of the most sensitive analysis methods available.

The QUANTAX family of EDS systems offered by Bruker AXS Microanalysis delivers reliable results across a broad range of applications with unprecedented speed, accuracy and ease of use.

Bruker's unique, liquid nitrogen free XFlash® silicon drift detectors (SDD) together with the state-of-the-art hybrid pulse processor technology deliver both the highest possible energy resolution and over ten times the speed of conventional Si(Li) based systems, both on scanning electron microscopes and on (scanning) transmission electron microscopes.

XFlash 5030 (156 KB)

The XFlash® 5030 detector for the Bruker QUANTAX comes with an active area of 30mm² and an improved electron trap that causes no interference at low microscope acceleration voltages. The detector is available with an excellent energy resolution of down to 127 eV at MnKa. These properties make this detector the instrument of choice for low beam current / count rate conditions like found in cold-cathode field emission SEMs and environmental SEMs. Nevertheless, the XFlash® 5030 can also easily cope with high input count rates up to 750,000 cps.

XFlash 5030 T (139 KB)

Bruker was the first company to design an SDD specifically for S / TEM application, the XFlash® 5030 T. Construction and materials selection were specially adapted to meet them main requirement: to cause minimum interference even on sensitive Cs-corrected instruments. Also, the detector is small, light-weight and thermoelectrically cooled (no cold trap in the instrument, no microphony through LN2). The XFlash® 5030 T with 30 mm² active area is an allrounder that can be used for all types of analyses at high or low count rates. The detector does not "go blind", when crossing a grid bar at lower magnifications and copes with input count rates up to 750,000 cps.

XFlash 5060 T (155 KB)

The new large area 60 mm² SDD XFlash® 5060 T is the detector of choice, when doing S/TEM chemical analysis at low beam currents or of samples with low X-ray yield. With technical parameters otherwise identical to those of the XFlash® 5030 T (e.g. 127 eV energy resolution at Mn Ka) the larger solid angle is the decisive advantage of this detector.

M4 TORNADO (377 KB)

The S2 PICOFOX is the world's first portable benchtop spectrometer for fast quantitative and semi-quantitative multi-element microanalysis of liquids, suspensions, solids and nano-particles using the principle of total reflection X-ray fluorescence spectroscopy. Reaching detection limits in the ppb and ppm range the S2 PICOFOX is optimally suited for trace element analysis.

S2 PICOFOX (459 KB)

µ-XRF is the method of choice for highly sensitive and non-destructive elemental analysis of diverse samples, including inhomogeneous and irregularly shaped specimens. The M4 TORNADO is a versatile instrument for fast and accurate high-resolution analysis of both small and large specimens. Samples require little or even no preparation at all for examination. Samples can be analyzed in spot mode, using line scans or single-frame or stitched element maps supporting spectral imaging technology (HyperMap).

The Bruker QUANTAX X-ray spectrometer for electron microscopy (click on image to enlarge)

The Bruker XFlash® 5010 detector for scanning electron microscopy (SEM) (click on image to enlarge)

The Bruker XFlash® 5030 detector for SEM (click on image to enlarge)

The Bruker XFlash® QUAD 5040 four-channel detector for SEM (click on image to enlarge)

The Bruker XFlash® 5030 T detector for transmission electron microscopy (click on image to enlarge)

The Bruker M4 TORNADO fast 2D µ-XRF spectrometer (click on image to enlarge)

The Bruker S2 PICOFO total reflection X-ray fluorescence spectrometer for trace analysis (click on image to enlarge)