FEI» is the world leader in electron optics and focused ion beam technologies. FEI's market-leading solutions deliver precision imaging for three-dimensional characterization, analysis and modification of materials and structures with resolution down to the sub-Ångström level.
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Metallurgical inspection using the Phenom – The properties of many engineering materials are mostly governed by a combination of metal composition and the morphology and distribution of key microstructural features. These features can be observed with conventional optical microscopy. However, when higher magnification and 3-D detail is required, a scanning electron microscope (SEM) is best suited.
How do you stay at the forefront of your field and remain competitive in a world where critical dimensions are now in the nanometer range? At FEI, we have consistently helped organizations break new ground by providing the highest resolution imaging and analytical tools. Now we are proud to introduce Phenom: a unique imaging tool that brings a new dimension to microscopy. Never before could you get this level of image quality, resolution and sample throughput at such a low price point. Phenom makes high-end imaging practical and affordable for all.
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Phenom use for pharmaceutical inspection. This application note illustrates how the Phenom can be used as a simple "point and shoot" instrument for the rapid inspection and qualitative characterization of pharmaceutical particles.
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Benchtop microscopy at 20,000 X – faster than the speed of light. The rapidly accelerating pace of development in micro- and nanotechnologies has created growing demand for imaging capability beyond the 1000X magnification available from a typical light microscope (LM). Scanning electron microscopes (SEM) can generate useable information at magnifications higher than 100,000X, but they are typically slower, harder to use and more expensive than LM. Now, an innovative benchtop imaging system (Phenom™, FEI Company) combines the power of SEM with the speed and convenience of LM, delivering crisp, clear images at magnifications up to 20,000X with about as much effort as a point-and-shoot camera.
Phenom is a high resolution desktop imaging tool that is fast and easy to use. It takes you through the world of optical and electron microscopy – from millimeters to the nano scale – in seconds. With magnifications of 20x to 20,000x and an ultimate resolution of 30 nm, it’s ideal for routine inspection of materials, detailed imaging or classroom instruction. Phenom is extremely easy to operate as well, meaning everyone in your team can run it. Research institutes can use its capabilities to discover next generation materials. Manufacturers can optimize production ramps and reduce the time for root cause analysis. Educators can take an exciting leap in teaching methods by bringing a world that students have never seen before into the classroom.
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Fiber classification with the Phenom. Fibers play an important part in everyday materials and cutting edge research. The Phenom has been used to investigate several different cutting edge applications in industries covering filtration, medical equipment, insulation, aerospace, and nanotechnology. It provides accurate information about fibers like general construction, diameter, and surface morphology.
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Phenom – the perfect addiion to your SEM lab. The ease of use, high throughput, and imaging power of the Phenom make it a valuable compliment to any analytical SEM laboratory. A 30-second load time and intuitive user-interface allow rapid imaging of samples with a minimal investment in user training. The Phenom uses industry standard pin-stub SEM sample mounts, allowing samples to be transferred between SEMs easily. By screening samples, users can reduce workload pressure on existing SEMs while preparing a navigation map for samples that do require further examination in an analytical SEM.
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Topography imaging with Phenom. Phenom Backscattered Electron Detector provides topographical images in addition to compositional images – via an easy-to-use interface. The 4-segment detector design puts more information into every image.
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Fiber Analysis made Faster, Better and Easier with the FEI®Fibermetric™ System powered by Phenom. Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter.
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Phenom. Phenom is the easiest-to-use SEM ever made, breaking through the performance barriers of optical microscopes while defining a new standard for usability by non-experts.
