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Park Systems
 

Looking for state-of-the art Atomic Force Microscope (AFM) instrumentation?

Park Systems’ AFM solutions are derived from our innovations and meet the most rigorous scientific research and nano-manufacturing process control requirements across various fields. Park Systems instruments are engineered for advanced R&D modes and day-in, day-out metrology processes monitoring at manufacturing facilities. Please contact us at your earliest convenience and we can share our experience with you.
 

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XE-Bio (1 MB)

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope desidned specifically for biomedical and other advanced life scien research. The revolutionary Scanning Ion Conductance Mode (SICM) is specifically designed for non-invasive in-liquid imaging.

       
     
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XE-NSOM (1.1 MB)

XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM), Raman Spectroscopy, and Confocal Microscopy. XE_NSOM provides a complete AFM setup with unsurpassed versatility for these optical experiments.

       
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XE-150 (1.1 MB)

With the arrival of the XE-150, Park Systems' large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with the ultimate AFM resultion and reliability. The XY motorized sample stage is optimized for large sample (150mm x 150mm) placement and allows full travel over the entire sample.

         
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XE-100 (750 KB)

The XE-100 is our flagship AFM. It is a mid-priced system that provides the ultimate AFM/SPM solution for Non-Contact nanoscale metrology of small samples in data storage, semiconductors, nanoscience, materials science, polymers, and electrochemistry.

       
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