Park Systems Showroom

How to evaluate an AFM? (pdf)

NX10 Product Brochure (856 KB)

Data accuracy is of paramount importance to nanotechnology researchers as the credibility of their research depends upon accurate results. The NX10, the world's most accurate AFM, is the flagship AFM of Park Systems' new product line. The NX10 brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price.

Scanning_Thermal_Microscopy (SThM) (pdf)

True non-contact AFM for soft biological samples (pdf)

True non-contact mode vs. tapping imaging (pdf)

True non-contact mode (pdf)

XE-NSOM (700 KB)

XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM), Raman Spectroscopy, and Confocal Microscopy.

Ultimate Resolution of AFM in air (pdf)

Ion Conductance Microscope (pdf)

Basic Contact AFM & Dynamic Force Microscope (pdf)

XE-150 (1.1 MB)

With the arrival of the XE-150, Park Systems' large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with the ultimate AFM resultion and reliability. The XY motorized sample stage is optimized for large sample placement and allows full travel over the entire sample.

Force-distance Spectroscopy (pdf)

Lateral-force Spectroscopy (pdf)

Phase Imaging & Phase Detection Microscopy (pdf)

Conductive AFM (pdf)

XE-100 (570 KB)

The XE-100 is s a mid-priced system that provides the ultimate AFM/SPM solution for Non-Contact nanometrology of small samples in data storage, semiconductors, nanoscience, materials science, polymers, and electrochemistry.

Electric Force Microscopy (pdf)

Force Modulation Microscopy (pdf)

Magnetic Force Microscopy (pdf)

NanoIndentation (pdf)

XE-120 (840 KB)

For combined capability of XE-AFM and Inverted Optical Microscope

Nanolithograpy (pdf)

Scanning Capacitance Microscopy (pdf)

AFM and Confocal Microscopy (pdf)

XE-70 (670 KB)

Affordable, Research-Grade AFM with Flexible Sample Handling

Scanning Tunneling Microscopy (pdf)

Atomic Force Microscopy Investigation of 1D Structures Utilizing the XE-series Instruments (pdf)

XE-HDM (760 KB)

Automatic Defect Review AFM for Hard Disk Media and Substrates

Characterization of Epitaxially Grown MnAs Films Using AFM and MFM (pdf)

Characterization of Organic Photovoltaic Cells (pdf)

XE-WAFER (890 KB)

Automated Industrial AFM for In-line wafer Inspection and Metrology

Patterned Arrays of Magnetic Nanostructures (pdf)

Production and Measurement of Nanodot Array (pdf)

XE-PTR (745 KB)

Automated Industrial AFM for Metrology of Read/Write Heads

Surface Morphology of Electrospun Fibers (pdf)

Surface Topography Considerations of Patterned Sapphire Substrates for Blue/Green Light Emitting Diode (pdf)

XE-3DM (960 KB)

Automated Industrial AFM for High-Resolution 3D Metrology

AFM Metrology Considerations of Hard Disk Manufacturing (pdf)

Automatic Defect Review AFM for Hard Disk Media and Substrates (pdf)

XE-Bio (650 KB)

The XE-Bio is an innovative yet user-friendly Atomic Force Microscope desidned specifically for biomedical and other advanced life scien research. The revolutionary Scanning Ion Conductance Mode (SICM) is specifically designed for non-invasive in-liquid imaging.

New 3D-AFM for High Resolution Sidewall Imaging (pdf)

Patterned Arrays of Magnetic Nanostructures (pdf)

Chemical Mechanical Polishing (CMP) Metrology with Advanced AFM Surface Profile (pdf)

Critical Dimension Measurement of High Aspect Ratio Trench with XE AFM (pdf)

New 3D-AFM for High Resolution Sidewall Imaging (pdf)

XE-3DM

Innovative Atomic Force Microscopy - bridging the gap to real world investigation

Characterization of Epitaxially Grown MnAs Films Using AFM and MFM Equipment