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Posted: Mar 25, 2014

Hiden Announces New Surface and Surface Interface Diagnostic Systems

(Nanowerk News) Hiden Analytical announces a new range of surface and surface interface diagnostic tools. Based on the UHV Secondary Ion Mass Spectrometry (SIMS) technique the new tools provide for high performance surface elemental and contamination analysis together with depth profiling with nanometer scale depth resolution.
UHV Secondary Ion Mass Spectrometry workstation
SIMS workstation
Hiden surface diagnostics systems are designed to work well with many sample types including metallurgical thin films, coatings, solar cells, and semiconductors. Crucially the new systems include excellent depth and spatial resolution providing 3D images of the uppermost layers of surfaces and thin films on a nano/micron scale. A wide range of sample sizes and shapes can be accommodated in the UHV sample load lock making the Hiden surface diagnostics tools extremely versatile.
Historically high performance SIMS tools have only been available at a very high capital cost combined with an ongoing high cost of ownership. The Hiden SIMS analysis tool is a modular system starting at a foundation level and offers world class performance at an affordable price level combined with extremely low cost of ownership. The systems include a dedicated SIMS user interface making operation straightforward, with user training for a new starter typically completed within just 2 -3 days.
For further information on this or any other Hiden Analytical products contact Hiden at info@hiden.co.uk or visit the main website at www.HidenAnalytical.com.
Source: Hiden Analytical (press release)
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