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Fibics provides analysis solutions to semiconductor and materials science / metallurgy clients, specializing in focused ion beam (FIB), secondary ion mass spectrometry (SIMS) and transmission electron microscopy (TEM).
With the development of novel nano-materials with incresased thermal transport poperties, there is a critical need to be able to accurately measure small changes in thermal conductivity. ThermTest can assist with testing and intrumentation needs.
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