Nanotechnology Databases

Comprehensive databases for nanomaterials, events, products,
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Nanotechnology Products, Applications & Instruments

 

Showing results 41 - 60 of 105 for companies in category Analysis in USA:

 
Nanometer Pattern Generation System for Direct Write Lithography using a commercial Electron or Ion Beam Microscope.
Jordan Valley Semiconductors, Inc. provides industry-leading metrology solutions for thin films, based on novel, rapid, non-contacting, and non-destructive X-ray technology.
The company is a leading supplier of factory automation sensors, measuring instruments and digital microscopes.
Labsphere is world leader in light testing and measurement, and optical coatings. The company?s products include LED, laser and traditional light source light measurement systems; uniform light sources for imaging device calibration; spectroscopy accessories; and high diffuse reflectance materials and coatings for applications in backlit panel displays, computed radiography, and system calibration.
The company develops innovative measurement and control technologies for researchers studying the physical properties of metals and ceramics at very low temperatures. Typical materials that can be measured include nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices.
LDB Corp provides metrology instruments to industrial component and semiconductor companies.
Left Coast Instruments, Inc. offer advanced nanotechnology instruments including Ultra-Fast Confocal Line Scanning Raman Microscopy; Second Harmonic Generation Microscopy; Combined Raman - Fluorescence Microscopy; Scanning Electron Microscopy & X-Ray Microanalysis; Phase Contrast 2D & 3D Tomographic X-ray Imaging; Ion Beam Milling and Cross Sectioning Systems.
LightForm develops and sells hyperspectral imaging instrumentation to life science researchers.
Masscal Scientific Instruments is dedicated to the development, distribution and application of laboratory instruments which utilize core patented technologies for the simultaneous measurements of mass, heat flow and viscoelasticity of thin films and similar samples undergoing reactions within precisely controlled environments.
LASAW analytical instrument - laser actuated surface acoustic wave analysis of thin film materials. Analysis of physical/mechanical properties such as hardness, density, and elasticity of thin film materials down to the meso/nano level thickness.
Manufacturer of laser particle size measurement instruments.
MikroMasch supplies a wide range of AFM probes, calibration gratings and other accessories for scanning probe microscopes.
Develops and manufactures the world's highest resolution Atomic Force Prober (AFP).
A supplier for a variety of AFM systems, probes, accessories, and related nanoscience tools.
NanoSpective specializes in advanced materials characterization. The company uses cutting edge technology and state of the art equipment to perform nanoscale and macroscopic property evaluation of materials.
Nanotech America (NTA) is the distributor of the family of Scanning Probe Microscopes manufactured by NT-MDT (Zelenograd, Russia).
A microscopy and software company delivering rapid testing and analysis solutions to sectors ranging from materials science, and semiconductors to life science and medicine.
Nanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Their core technologies are microscopy, metrology and spectroscopy.
Nanovea manufactures Profilometers, Mechanical Testers & Tribometers to combine the most advanced testing capabilities in the industry: Scratch/Adhesion, Indentation/Hardness, Wear/Friction & 3D Non-Contact Metrology at Nano, Micro & Macro range. Unlike other manufactures Nanovea also provides Laboratory Services, offering clients availability to the latest technology and optimal results through improvements in testing standards.
Develops Scanning Probe Position Encoder (SPPE) technology.
 
 
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