A manufacturer and distributor of instruments and services in the particle science field. The product line includes laboratory and process analyzers for testing powders, granular materials, dispersions, emulsions, and aggregate.
The company's SensorMetric™ software packages help Sensory systems meet a breadth and depth of application challenges to include color measurement, nanometric measurement, primer measurement and L/O coating thickness measurement on a wide variety of metallic and non-metallic substrates.
The company manufactures instruments and software for the analytical laboratory industry. It's Analytical Division is one of the world?s largest manufacturers of analytical instrumentation and environmental monitoring equipment.
Skyray XRF is the North American representative of Skyray Instrument, Inc. Established in 1990, Skyray Instrument, Inc specializes in X-Ray Fluorescence spectrometer (XRF) research, development, production and sales.
Solar Metrology is a global leader in high-performance X-Ray Fluorescence (XRF) analysis systems. Solar Metrology XRF tools are specifically engineered for the demanding thin film measurement requirements of the Solar Electric and Power Storage industries.
Ted Pella, Inc ia a leading manufacturer of consumables, supplies, tools and specimen preparation equipment for all disciplines of microscopy and nanotechnology. Specialized in specimen mounts and holders for SEM, FIB, support films and grids for TEM, calibrations standards and sample storage.
XOS® has been a leading global provider of advanced X-ray optics for material analysis systems since the optics' commercial introduction in the mid-1990s. The systems are important for essentially all industries that use materials – from cement to semiconductor to pharmaceutical to petroleum – measuring aspects such as semiconductor film thickness, stress in turbine blades, groundwater contamination, and contaminant levels.
Manufactures nanodevices based on individual carbon nanotubes (CNTs) and CNT arrays with well-controlled properties using a proprietary, scalable core process - CNT based probes for high-end microscopy tools, including CNT tips for Atomic Force Microscopes (AFMs); CNT field emitters for Scanning Electron Microscopes (SEMs).
XiGo Nanotools' range of particle characterization products provides measurements of particle size, particle size distribution, and surface area. XiGo Nanotools also offers contract testing, consulting, or training in particle characterization.