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Showing results 101 - 105 of 105 for companies in category Analysis in USA:

 
XiGo Nanotools' range of particle characterization products provides measurements of particle size, particle size distribution, and surface area. XiGo Nanotools also offers contract testing, consulting, or training in particle characterization.
Major products include: carbon nanotube(CNT)-based field emission electron source, field emission grade CNT material, field emission x-ray source and CNT AFM probes.
Designs and manufactures a suite of ultra high resolution 3D x-ray microscopes and fluorescence imaging systems for non-destructive imaging of embedded internal structures.
Zemetrics is a manufacturer of high-precision, optical profilometer measurement systems for surface metrology.
Zeta Instruments' Focus Map technology brings 3-D imaging and metrology capabilities to your microscope.
 
 
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