KP Technology is an award-winning company that designs and manufactures Kelvin Probe systems for work function and surface potential measurements. The company supplies state-of-the-art equipment and consultancy services to innovative companies and research institutes throughout the world.
Labsphere is world leader in light testing and measurement, and optical coatings. The company?s products include LED, laser and traditional light source light measurement systems; uniform light sources for imaging device calibration; spectroscopy accessories; and high diffuse reflectance materials and coatings for applications in backlit panel displays, computed radiography, and system calibration.
The company develops innovative measurement and control technologies for researchers studying the physical properties of metals and ceramics at very low temperatures. Typical materials that can be measured include nanoscale electronics, quantum wires and dots, organic and dilute magnetic semiconductors, superconductors, and spintronics devices.
Left Coast Instruments, Inc. offer advanced nanotechnology instruments including Ultra-Fast Confocal Line Scanning Raman Microscopy; Second Harmonic Generation Microscopy; Combined Raman - Fluorescence Microscopy; Scanning Electron Microscopy & X-Ray Microanalysis; Phase Contrast 2D & 3D Tomographic X-ray Imaging; Ion Beam Milling and Cross Sectioning Systems.
The company develops, produces and distributes 3D analysis instruments based on the Digital Holographic Microscopy (DHM) technology. With this technology, microscopes combine nanometric resolution, real-time and non-invasive three dimensional observation
Masscal Scientific Instruments is dedicated to the development, distribution and application of laboratory instruments which utilize core patented technologies for the simultaneous measurements of mass, heat flow and viscoelasticity of thin films and similar samples undergoing reactions within precisely controlled environments.
LASAW analytical instrument - laser actuated surface acoustic wave analysis of thin film materials. Analysis of physical/mechanical properties such as hardness, density, and elasticity of thin film materials down to the meso/nano level thickness.
The Naneum 'SAC' range of instruments includes portable size-selective devices which measure aerosol particle concentrations in the nano-particulate size range - that is down to one nanometre of diameter.