Nanotechnology Databases

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Nanotechnology Products, Applications & Instruments


Showing results 126 - 150 of 221 for companies in category Analysis:

Manufactures scanning probes for scanning probe microscopy.
NanoSpective specializes in advanced materials characterization. The company uses cutting edge technology and state of the art equipment to perform nanoscale and macroscopic property evaluation of materials.
Nanosurf is a leading manufacturer of atomic force microscopes and scanning tunneling microscopes. Our full range of AFM and STM products is trusted by professionals worldwide to help them visualize, analyze, and manipulate objects and surfaces at the nanoscale. Nanosurf microscopes excel through their smart design, innovative technology, and intuitive operation.
Nanotech America (NTA) is the distributor of the family of Scanning Probe Microscopes manufactured by NT-MDT (Zelenograd, Russia).
Offers a wide range of diamond like AFM tips.
A microscopy and software company delivering rapid testing and analysis solutions to sectors ranging from materials science, and semiconductors to life science and medicine.
Nanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Their core technologies are microscopy, metrology and spectroscopy.
Nanovea manufactures Profilometers, Mechanical Testers & Tribometers to combine the most advanced testing capabilities in the industry: Scratch/Adhesion, Indentation/Hardness, Wear/Friction & 3D Non-Contact Metrology at Nano, Micro & Macro range. Unlike other manufactures Nanovea also provides Laboratory Services, offering clients availability to the latest technology and optimal results through improvements in testing standards.
Develops Scanning Probe Position Encoder (SPPE) technology.
Swiss company that provides silicon and silicon nitride cantilevers and probes for SPM and AFM
The company has developed a breakthrough nanofabrication technology to grow constant diameter, silver-gallium (Ag2Ga) nanoneedles, at any preferred location (e.g. SPM Probe tips) and orientation.
NenoVision was established in 2015 as a spin-off of the Brno University of Technology and The Central European Institute of Technology (CEITEC) in the Czech Republic. NenoVision brings innovative Correlative Probe and Electron Microscopy technology to the market.
Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, X-ray and Computed Tomography (CT), Optical CNC measuring systems , Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering.
Specializes in advanced electron optics, especially the optics of very-high resolution electron microscopes.
Nova Measuring Instruments Ltd. is a leading global semiconductor equipment manufacturer with solutions and services that are used by 21 of the largest 25 IC manufacturers. Nova's expertise in Thin Film and Optical CD & shape profiling metrology systems are addressing the complex measurement and process control challenges of High Volume Production (HVM) in 300 & 200 mm IC manufacturing, from 90nm to the demanding 45nm and 32nm technology nodes.
The company designs and manufactures high precision optical metrology systems for 3D non-contact inspection and imaging.
Develops and produces innnovative and state of the art devices that facilitate nanotechnology projects. These improvements range from specialized AFM instruments to the probes and sensors used to characterize samples.
Atomic Force Microscopy for nanotechnology, scientific research & education.
A system solution provider in microscopy the company develops and manufactures TEM, SEM and scanning probe tips using electro beams positioned with nano precision.
The company's range of microscopes includes laser scanning confocal microscopes that offer high-resolution 3D observation and measurement in real time for applications in nanotechnology production.
Provides instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales along with surface modification and laser lithography.
A supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF).
Manufacturers of the ActiPix™ range of capillary-based UV absorbance detectors and spectrophotometers for applications including monitoring nanoscale biocatalytic reactions and measuring molecular size of both small molecules and biomolecules.
Park Systems serves its customers with a complete range of AFM solutions including AFM systems, options, and software, along with global service and support.
Particle Metrix supplies instruments and services for particle characterisation and dispersion stability analysis. The focus is on small particles starting from 1 nm upwards or, from nano- and micro - particle dispersions to powders in the µm to mm range. The portfolio of instruments and services is based on own particle charge analysers and particle size and shape analysers from Microtrac Inc. and Occhio S.a.r.l.
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