Nanoscribe develops compact and easy-to-operate table-top laser lithography systems, allowing for true three-dimensional nanostructures in commercially available photoresists. Furthermore, the company offers the service of producing samples specially designed for the needs of the customer, including also the conversion or inversion of 3D structures into SiO2 and Si, as well as writing into different photoactive materials, such as chalcogenide glasses.
NanoSpective specializes in advanced materials characterization. The company uses cutting edge technology and state of the art equipment to perform nanoscale and macroscopic property evaluation of materials.
Nanounity supplies surface science analytical solutions through a range of synergistic products through partnerships with leading instrumentation manufacturers. Their core technologies are microscopy, metrology and spectroscopy.
Nanovea manufactures Profilometers, Mechanical Testers & Tribometers to combine the most advanced testing capabilities in the industry: Scratch/Adhesion, Indentation/Hardness, Wear/Friction & 3D Non-Contact Metrology at Nano, Micro & Macro range. Unlike other manufactures Nanovea also provides Laboratory Services, offering clients availability to the latest technology and optimal results through improvements in testing standards.
NenoVision was established in 2015 as a spin-off of the Brno University of Technology and The Central European Institute of Technology (CEITEC) in the Czech Republic. NenoVision brings innovative Correlative Probe and Electron Microscopy technology to the market.
Nikon Metrology offers a complete range of metrology solutions including Coordinate Measuring Machines(CMMs), Optical CMMs, 3D laser scanners, X-ray and Computed Tomography (CT), Optical CNC measuring systems , Laser Radar, iGPS /iSpace systems, and metrology software for 3D scanning, 3D digitizing, 3D inspection and reverse engineering.
Nova Measuring Instruments Ltd. is a leading global semiconductor equipment manufacturer with solutions and services that are used by 21 of the largest 25 IC manufacturers. Nova's expertise in Thin Film and Optical CD & shape profiling metrology systems are addressing the complex measurement and process control challenges of High Volume Production (HVM) in 300 & 200 mm IC manufacturing, from 90nm to the demanding 45nm and 32nm technology nodes.
Develops and produces innnovative and state of the art devices that facilitate nanotechnology projects. These improvements range from specialized AFM instruments to the probes and sensors used to characterize samples.
Provides instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales along with surface modification and laser lithography.