Ted Pella, Inc ia a leading manufacturer of consumables, supplies, tools and specimen preparation equipment for all disciplines of microscopy and nanotechnology. Specialized in specimen mounts and holders for SEM, FIB, support films and grids for TEM, calibrations standards and sample storage.
Overcome bulk limitations of conventional optics with the OCTANE nanophotonic spectrometer. This turn-key fully integrated package never requires alignment and can be customized for high-resolution or broad-bandwidth preferences. Extreme miniaturization allows for multiple independent spectrometers in one system.
VeriCold Technologies is specialized in cutting-edge X-ray spectroscopy and cooling solutions. Driven by innovative markets (semiconductor, biotechnology and nanotechnology) VeriCold's technology is a key-enabler for new processes in manufacturing, quality control and research.
A manufacturer of high performance instrumentation for scientific and industrial applications focused on new solutions for Optical and Scanning Probe Microscopy: SNOM (NSOM), Confocal Raman Microscopy, AFM, SPM, PFM.
XOS® has been a leading global provider of advanced X-ray optics for material analysis systems since the optics' commercial introduction in the mid-1990s. The systems are important for essentially all industries that use materials – from cement to semiconductor to pharmaceutical to petroleum – measuring aspects such as semiconductor film thickness, stress in turbine blades, groundwater contamination, and contaminant levels.
Xenocs is a supplier of X-ray optics and X-ray optical components. Using proprietary manufacturing technologies based on precision free-form optical surfaces including aspheric substrates, sub-nanometer precision multilayer coating technology and innovative single reflection optical concepts, Xenocs manufactures a wide range of X-ray optical components.
Manufactures nanodevices based on individual carbon nanotubes (CNTs) and CNT arrays with well-controlled properties using a proprietary, scalable core process - CNT based probes for high-end microscopy tools, including CNT tips for Atomic Force Microscopes (AFMs); CNT field emitters for Scanning Electron Microscopes (SEMs).
XiGo Nanotools' range of particle characterization products provides measurements of particle size, particle size distribution, and surface area. XiGo Nanotools also offers contract testing, consulting, or training in particle characterization.