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Posted: April 21, 2009
Conference offers insight into exploration of nanoelectronics
(Nanowerk News) New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics industry will be the focus of the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, to be held the week of May 11-15, 2009, at the University at Albany.
As the electronics industry creates ever-smaller and faster chips and moves beyond silicon technology, it looks to the scientific community to provide novel measurement methods and innovative ways of using them to increase performance. Scientists and engineers from around the world will converge on the university’s College of Nanoscale Science and Engineering to discuss the challenges of exploring and characterizing these new innovations.
“The most attractive conference sessions for journalists to attend are likely the first two,” said David Seiler, chief of the Semiconductor Electronics Division at the National Institute of Standards and Technology (NIST), which is co-sponsoring the conference. The two sessions on May 12 will include keynote talks from industry leaders and an overview of nanoelectronics technology. A full conference program is available at www.eeel.nist.gov/812/conference/.
The cost for full registration, including meals, special event attendance and the hardbound conference proceedings, is $500 until the deadline of April 27, and $600 up to the conference start date.