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Posted: June 30, 2009

Premier Issue of 'Project TEST' E-Magazine Offers Articles, Video, and Online Resources

(Nanowerk News) Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has sponsored the premier issue of Project TEST, in cooperation with Electronic Products magazine and the Hearst Electronics Group. To read Project TEST, a unique 32-page electronic magazine edited for test and measurement engineers, visit http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php.
As the sponsor of the first issue, Keithley authors contributed a number of articles, including “Fundamentals of Semiconductor C-V Measurements,” “Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation,” “Trends in RF Testing,” and “Taking the Measure of Pulse Generators.” Other features of the premier issue include a viewpoint on “Real Innovation in Instrument Connectivity,” and an article on “Solutions for Testing MEMS Devices at the Wafer Level” from SUSS Microtech Test Systems.
Project TEST also provides access to a number of unique resources no print magazine can reproduce, including video product presentations, an interactive guide to digital multimeters, and an Electronic Products test and measurement news feed.
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Source: Keithley (press release)
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