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Posted: July 8, 2009
Carl Zeiss Expands SIGMA FE-SEM Platform
(Nanowerk News) Today, Carl Zeiss launches SIGMA VP, which adds variable pressure technology to the range of SIGMA field emission scanning electron microscopes (FE-SEM).
Featuring the Carl Zeiss GEMINI® column, proven VP technology and a design with analytical accessories in mind, the SIGMA VP provides a comprehensive analytical solution for a constantly growing diversity of applications. The chamber includes the provision for all WDS variants as well as a geometry suitable for coplanar EDS and EBSD analysis. The SIGMA VP is compatible with a wealth of accessories including the Carl Zeiss BSD and VPSE G3 detectors, which provide exceptional imaging of non-conducting specimens.
Outstanding flexibility and unrivalled ease of use are the core benefits of the new SIGMA FE-SEM with variable pressure mode.
The customer benefits of the SIGMA VP are a combination of outstanding flexibility and unrivalled ease of use with respect to both image acquisition and analytical applications. System control by means of SmartSEM®, the Carl Zeiss software package known for its intuitive interface, and the GEMINI column with user-friendly operation allow for excellent imaging by novices and experts alike.
With this launch Carl Zeiss further underlines its slogan: Maximum information – maximum insight.