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Posted: July 30, 2009
Achieve Up to 10x Faster Particle Analysis
(Nanowerk News) Oxford Instruments' automated feature and particle analysis system is now available with new image acquisition hardware INCAmicsF+ for even faster and more accurate data acquisition.
INCAmicsF+ includes new Fast Response Microprocessor (FRM) technology to detect smaller particles at least 3x faster. Combined with the revolutionary X-Max large area silicon drift detector, feature analysis can now be done in a fraction of the time. Sampling times can now be measured in minutes rather than hours.
“Automated feature detection and analysis in a SEM is an important technique in many application areas including GSR, steel inclusions, vehicle engines, disk drives and environmental monitoring,” says James Holland, Applications Manager at Oxford Instruments NanoAnalysis. “Using FeatureMax we have been able to detect more nano-particles and speed up acquisition by a massive amount. These gains in accuracy and productivity will offer great benefits in all these applications and more.”