Fischione NanoMill Now Available From Agar Scientific
(Nanowerk News) Agar Scientific, Fischione Instruments exclusive distributor of instrumentation in the UK & Ireland are pleased to announce the availability of the Model 1040 NanoMill® TEM specimen preparation system.
Using a revolutionary ultra-low-energy, concentrated ion beam, Fischione’s Model 1040 NanoMill® TEM specimen preparation system is an excellent tool for creating the high-quality thin specimens needed for advanced transmission electron microscopy (TEM) imaging and analysis. It is ideal for both post-FIB (focused ion beam) processing and the enhancement of conventionally-prepared specimens.
Fischione Instruments’ Model 1040 NanoMill® TEM specimen preparation system.
Applying the targeted, ultra-low-energy NanoMillingsm process, the NanoMill® system features gaseous ion source technology that results in ion energies as low as 50eV and a beam size as small as 2 microns. It allows specimens to be prepared without amorphization, implantation, or re-deposition. The ion beam can be targeted to a specific area of interest. A secondary electron detector (SED) is used to image the ion-induced secondary electrons that are generated from the targeted area of the specimen.
Its automated operation makes the NanoMill® system easily programmable. Adjustable ion beam energies, milling angles, specimen rotation, and cryogenic specimen cooling parameters afford maximum flexibility to ensure the optimal preparation of a wide variety of specimens. A vacuum load lock facilitates rapid specimen exchange for high-throughput applications.
A sixteen page brochure is available for downloading here. This provides full details of the new system illustrating its use with many high resolution applications from users around the world.
Agar supplies one of the broadest ranges of accessories and consumables for microscopy. The complete range is available in either electronic or printed-catalogue form. To receive your copy, please visit www.agarscientific.com and register today.