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Posted: September 15, 2009
New Mountains 5.1 From Digital Surf Available For Free Upgrade
(Nanowerk News) Digital Surf, the surface metrology solutions provider,
announced the release of Mountains® 5.1, the latest version of its Mountains® surface imaging and
analysis software. Mountains® 5.1 contains powerful new features for 3D optical microscopy,
dimensional analysis of 2D component geometry, dynamic statistics for near-line monitoring of
surface parameters, and new Cpk capability parameters. In addition, the new version exploits the
latest multi-core and 64-bit technology to accelerate analysis and also includes video tutorials with
audio and subtitles to minimize the learning curve for first time users.
Imaging and analysis of multi-channel topography (Z), color (RGB) and intensity (I) information
acquired by 3D confocal microscopes is provided by new Z-RGB-I functionality in Mountains® 5.1.
All three kinds of information can be manipulated simultaneously, for example when zooming in on a
surface feature. In addition both true color and intensity information can be superimposed on 3D
topographical height information.
Mountains® 5.1: multi-channel information on a surface including from left to right: topography (Z), color (RGB) and intensity (I).
Intelligent dimensional analysis of component geometry is provided by the optional Mountains®
Advanced Contour module. This module provides nominal form definition, magnified form deviation
graphics, form error parameters, support for large positional tolerances, Gothic Arch analysis, and
automatic generation of the quality report. It can be used for both mechanical and nanotechnology
Dynamic statistical analysis ensures that statistics are updated whenever a new sample is measured
in a production environment. An analysis template is applied automatically to all samples in the
measurement data population including the new sample, making it easy to monitor the trend of
surface parameters like Sq and to ensure that upper and lower tolerance limits are respected. In
addition, the implementation of Cpk parameters makes it possible to evaluate the statistical
capability of the manufacturing/fabrication system to repeat itself.
4D analysis of the evolution of 3D surface parameters – a feature unique to Mountains® - has been
enhanced so that the T-axis (time, temperature, magnetic field or another 4th dimension) can store
non-linear information. This means that it is possible, for example, to store information on 3D
measurements of a surface that are made at irregular intervals.
Mountains® 5.1 also includes features to speed up surface analysis and enhance interactivity.
Exploitation of multi-core technology accelerates time-consuming calculations. A 64-bit version
running under Windows Vista 64 provides faster processing of large data sets.
"The release of Mountains® 5.1 reflects our commitment to provide state of the art imaging and
analysis software for all surface metrology instruments, exploiting the latest technologies to
maximize productivity,” stated François Blateyron, Managing Director of Digital Surf’s Mountains
Surface Analysis Business Unit. "The new release is available free of charge to all users of
Mountains® 5.1 will be shown on the Digital Surf stand (2.M.5) at the Mesurexpo trade show in
Paris from the 6th to the 8th of October 2009.
About Digital Surf
Digital Surf, founded in 1989, is a leading provider of imaging and analysis software for surface
metrology instruments including 2D and 3D profilometers, optical microscopes and scanning probe
microscopes. Imaging and analysis software based on Digital Surf’s Mountains® technology is
integrated by leading instrument manufacturers and is used in thousands of laboratories and
industrial facilities working in numerous sectors including aerospace, automotive, cosmetics, energy,
MEMS, materials research, medical, metallurgy, nanostructures, optics, paper, PCB, plastics,
polymers, printing, semiconductor, etc.. Over 5,000 Mountain® software licences are installed