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Posted: November 13, 2009
Nanometrics Receives Multiple Metrology Orders for High-Brightness LEDs
(Nanowerk News) Nanometrics Incorporated, a leading supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, today announced multiple orders from new and existing HB-LED customers for RPMBlue™ and IVS185™ metrology systems, which will be used for photoluminescence (PL) mapping and critical dimension and overlay control, respectively. These systems are scheduled to be delivered and qualified in the fourth quarter of this year.
“We have continued to extend our leadership position in HB-LED metrology and process control with our newest PL mapping system, the RPMBlue,” commented Tom Ryan, Director of the Materials Characterization Business Unit at Nanometrics. “Our customers in Asia are adopting the high-productivity RPMBlue to support the rapidly-growing application of HB-LEDs for backlighting of notebook and LCD televisions. This latest round of RPMBlue orders comes from end-device manufacturers as well as a leading MOCVD reactor supplier. As the HB-LED process flow becomes increasingly complex, it drives the requirement for improved control of overlay and critical dimensions in the patterning process. Our IVS185 system, shipping for the first time to an HB-LED customer, is a cost-effective solution that incorporates both overlay and CD control in a single tool, with extendibility across multiple substrate sizes.”
Nanometrics offers a comprehensive line of products and technologies for HB-LED metrology and process control, including the RPMBlue for high-volume production of LEDs used in LCD backlighting, the Vertex™ PL mapping system to support leading-edge HB-LED process development, and the IVS185 overlay and CD system for advanced LED patterning process control. These systems are used by over 90% of the top-tier HB-LED manufacturers in development and production.
Nanometrics is a leader in the design, manufacture and marketing of high-performance process control metrology systems used primarily in the manufacturing of semiconductors, advanced wafer-scale packaging, solar photovoltaics and high-brightness LEDs, as well as by customers in the silicon wafer and data storage industries. Nanometrics standalone and integrated metrology systems measure various thin film properties, critical dimensions, overlay control, topography, and optical, electrical and material properties, including the structural composition of silicon, compound semiconductor and photovoltaic devices, during various steps of the manufacturing process, from front end of line substrate manufacturing through die preparation for advanced packaging. These systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide.