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Posted: March 22, 2010
X-Ray-based Metrology leader Jordan Valley Semiconductors Acquires Assets of Semiconductor Equipment Supplier Metrosol
(Nanowerk News) Jordan Valley Semiconductors Ltd. (JVS), a leading provider of X-ray based semiconductor metrology tools, has acquired the assets of Metrosol, an advanced Vacuum Ultra Violet (VUV) metrology tool firm, effective March 19, 2010.
Metrosol's state-of-the-art thin film measurement systems is a powerful metrology for the upcoming challenging ultra-thin films stacks of next-generation semiconductor nodes; it is also a proven technology for several critical applications for patterned imprint HDD Media manufacturing. Metrosol's short wavelength VUV metrology solution enables better and tighter process control on product wafers at a throughput suitable for high-volume manufacturing.
"The acquired VUV technology will strengthen Jordan Valley's position as a key metrology solutions provider for the sub 45nm semiconductors processes while expanding its capabilities to new markets such as the emerging patterned HDD market," commented Isaac Mazor, Jordan Valley CEO.
VUV technology is the most sensitive non-destructive optical metrology available for ultra thin FEOL layers such as Hi-K dielectric and Metal gates, therefore, complements Jordan Valley's well-established X-ray-based semiconductor metrology solutions, already in use in most advanced fabs worldwide.
Founded in 2002, Metrosol's SHORTY ES (Enhanced Spectrum) Series, short wavelength optical metrology systems is the only commercially-available technology able to collect optical reflectance data down to 120 nanometers. These shorter wavelengths enable greater sensitivity on thickness, composition, and optical property measurements on the complex films and stacks necessary to achieve desired device performance.
About Jordan Valley Semiconductors Ltd.
Jordan Valley Semiconductors Ltd. (JVS), the leader in X-ray metrology solutions for advanced semiconductor fabs, develops and supplies superior metrology equipment for quality control of thin films based on rapid, non-contacting and non-destructive X-ray technology. The company offers the Semiconductor Industry the most comprehensive array of tools, based on advanced XRR, XRF, HRXRD, WAXRD and SAXS technologies, ideal for both product or blanket wafers. For the compound semiconductors industries, JVS offers fast and economic HRXRD tools for high-brightness LED (HB-LED) manufacturing; this niche was added in 2008, through Jordan Valley's acquisition of U.K.-based Bede Ltd.
Jordan Valley's investors include Clal Industries and Investments Ltd. (TASE: CII), Intel Capital (Nasdaq: INTC) and Elron Electronics Industries Ltd. ( ELRN). With headquarters in Migdal Haemek Israel, the company has offices in Durham United Kingdom and Austin Texas USA, as well as representatives worldwide.
Metrosol, Inc., a developer, manufacturer and worldwide supplier of short wavelength optical metrology solutions, delivers advanced thin-film measurement systems that solve the needs of next-generation semiconductor manufacturing such as process monitoring and excursion suppression for high-k gate structures and multilayer dielectric stacks. Metrosol's VUV optical metrology technology offers the only commercially available platform capable of collecting reflectance data in the vacuum ultraviolet wavelength region down to 120 nm., Metrosol is a privately-held company based in Austin, Texas.
Source: Jordan Valley Semiconductors (press release)