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Posted: April 25, 2010
Taylor Hobson Launches Optical Profiler With Advanced Thin- and Thick Film Technology in Europe
(Nanowerk News) The new CCI SunStar from Taylor Hobson merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology.
Talysurf CCI delivers results you can trust with industry leading performance...
Film thickness measurement from 5 µm down to 300 nm or less
4 million pixel camera for high resolution imaging over a large area
Auto-range and auto-fringe-find for ease of use
Single mode of operation over all scan ranges for data you can trust
Strong, stable and robust closed loop Z scanning mechanism
New advances in interferometry are enabling more detailed studies of coatings
The latest interferometers can now use field reflectances from different layers of a coated surface to measure the thickness and the roughness of coatings. Two different approaches can be used, depending upon the coating thickness.
The Talysurf CCI SunStar has been designed to offer both types of film thickness measurement in additions to dimensional and roughness capability. Thick film analysis has been used in recent years to study semi-transparent coatings down to about 1.5 microns; the limit is dependent on the refractive index of the materials and the NA of the objective. Thinner coatings have proved more of a challenge.
It is now possible to study thin film coatings down to <300 nm (also refractive index dependent) by interferometry. This new approach allows the study of properties such as film thickness, interface roughness, pinhole defects and delamination of thin coated surfaces, all from a single measurement.
Thin Film Measurement
Thin film coatings are analyzed by the application of the helical complex field (HCF) approach, Patent Taylor Hobson. This is seamlessly integrated into the Talysurf CCI SunStar software and used alongside the standard dimensional and roughness measurement and analysis tools.
Thick Film Measurement
The example shown below is a polymer coating on metal. Information on film thickness, true top surface roughness and interface roughness can be be quickly obtained from a single measurement.