The latest news from academia, regulators
research labs and other things of interest
Posted: May 27, 2010
Nanometrics to Present at RBC Technology Conference
(Nanowerk News) Nanometrics Incorporated, a leading provider of advanced process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics, today announced that Dr. Timothy Stultz, President and CEO, will present at the RBC Capital Markets Technology, Media and Communications Conference in New York, NY on Thursday, June 10, 2010 at 9:00 a.m. EDT.
The presentation slides and an audio webcast will be made available on the investor page of Nanometrics' website, www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology systems used primarily in the fabrication of semiconductors, high-brightness LEDs, data storage devices and solar photovoltaics. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable device manufacturers to improve yields, increase productivity and lower their manufacturing costs. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Market under the symbol NANO.