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Posted: June 2, 2010
Graphene studies by different optical, AFM and spectroscopy techniques
(Nanowerk News) Combination of Atomic Force Microscopy (AFM), Raman / Fluorescence / Rayleigh
microscopy and Scanning Near-Field Optical Microscopy (SNOM) provides unique
opportunities for Graphene investigation. Different AFM techniques allow one to study
mechanical, electrical, magnetic and even elastic properties of Graphene flakes.
Studies of local work function, conductivity, capacitance, piezoresponse and many other surface
properties are also available. At the same time, Raman microscopy (available
simultaneously with AFM) provides information about flake thickness, structural uniformity,
presence of impurities and defects etc. Additionally, Rayleigh imaging and SNOM measure
local optical properties of the sample providing further information about flake structure.
Importantly, most of the measurements can be performed under environmental control: at
variable humidity and temperature, in controlled atmosphere, in liquid and even (in some
configurations) in electrochemical environment and at the external magnetic field.
Instrumentation from NT-MDT, the NTEGRA Spectra, provides the opportunity to carry out all the
measurements by the same instrument,
on the same sample during the same
experiment. It is possible to obtain AFM /
Raman / Fluorescence / Rayleigh / maps
exactly from the same area during one
sample scan. All AFM and spectral data
analysis are performed with the same software.