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Posted: Nov 19, 2010
X-ray Scattering Methods for Characterization of Nano-Materials Workshop at MRS Fall 2010
(Nanowerk News) Elucidating structural parameters of nanomaterials will be the hot topic at the upcoming workshop 'X-ray Scattering Methods for Characterization of Nano-Materials', to be held on December 3, 2010 during the MRS Fall 2010 conference in Boston, MA.
"This workshop is a unique opportunity to gain knowledge from the experts in the field about the latest X-ray analytical tools available to scientists and engineers for materials characterization", states Dr. Robert L. Snyder, Professor and Chair of the School of Materials Science and Engineering at the Georgia Institute of Technology. Prof. Snyder is co-organizer of the workshop along with Dr. Iuliana Cernatescu, Principal Scientist at PANalytical Inc.
The aim of this workshop is to give the attendees insight into valuable characterization tools to help unravel nanostructural parameters of samples and/or devices by using X-ray diffraction and scattering techniques. Leading experts on each scattering method will give a practical tutorial on how to apply different scattering methods to nanomaterials characterization and what parameters can be extracted from each method. Invited instructors include: Prof. Z. L. Wang and Prof. Robert L. Snyder of Georgia Institute of Technology, Dr. Thomas Proffen of Los Alamos National Laboratory, Dr. Andrew Payzant of the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory, Dr. Hans te Nijenhuis of PANalytical B.V, the Netherlands and Dr. Iuliana Cernatescu of PANalytical Inc., USA. The workshop will conclude with a field trip to tour PANalytical's Applications Laboratory in Westborough, MA where the participants can see the latest developments in X-ray diffraction laboratory systems.
Researchers, scientists, academics, industrial laboratory staff, engineers, educators and leading professionals in the field of nanotechnology, synthesis and applications of nanomaterials, thin film, energy storage materials, solar cells, H-storage materials, batteries and advanced materials will be able to learn how classical and novel X-ray diffraction and scattering methods can help in their work.
PANalytical is the world's leading supplier of analytical instrumentation and software for X-ray diffraction (XRD) and X-ray fluorescence spectrometry (XRF), with more than half a century of experience. The materials characterization equipment is used for scientific research and development, for industrial process control applications and for semiconductor metrology.
PANalytical, founded in 1948 as part of Philips, employs around 900 people worldwide. Its headquarters are in Almelo, the Netherlands. Fully equipped application laboratories are established in Japan, China, the USA, and the Netherlands. PANalytical's research activities are based in Almelo (NL) and on the campus of the University of Sussex in Brighton (UK). Supply and competence centers are located on two sites in the Netherlands: Almelo (development and production of X-ray instruments) and Eindhoven (development and production of X-ray tubes). A sales and service network in more than 60 countries ensures unrivalled levels of customer support.
The company is certified in accordance with ISO9001-2008 and ISO 14001.
The product portfolio includes a broad range of XRD and XRF systems and software widely used for the analysis and materials characterization of products such as cement, metals and steel, nanomaterials, plastics, polymers and petrochemicals, industrial minerals, glass, catalysts, semiconductors, thin films and advanced materials, pharmaceutical solids, recycled materials and environmental samples.
Visit the website at www.panalytical.com for more information about our activities.
PANalytical is part of Spectris plc, the precision instrumentation and controls company.