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Posted: Jan 10, 2011

Particle and Molecular Characterization Focus for Malvern Instruments Short Courses at Pittcon 2011

(Nanowerk News) Malvern Instruments will run two one-day short courses as part of the established program at Pittcon 2011 (March 13th -18th 2011; Atlanta GA). The first of these on March 14th covers the fundamentals of particle sizing with an emphasis on light scattering techniques, and the second, which takes place March 16th, examines molecular and particle characterization by dynamic light scattering and zeta potential. Registration is open for both via the Pittcon website www.pittcon.org
'Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques' will bring newcomers to the particle sizing field up to speed on the basics of particle size analysis. The main techniques (sieves, sedimentation, electrozone sensing) will be covered with an emphasis on dynamic light scattering and laser diffraction.
'Molecular and Particle Characterization by Dynamic Light Scattering and Zeta Potential will discuss, review and provide useful tips for dynamic light scattering (DLS, PCS, QELS), molecular weight and electrophoretic light scattering (zeta potential) measurements.
For details and to sign up visit:
Fundamentals of Particle Size Analysis with an Emphasis on Light Scattering Techniques http://bit.ly/aTT7Sw
Molecular & Particle Characterization by DLS & Zeta Potential http://bit.ly/cSriss
Source: Malvern Instruments (press release)
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