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Posted: Jan 27, 2011
Advanced AFM Tutorial Offered at the 3rd Multifrequency AFM Conference in Madrid
(Nanowerk News) Asylum Research, the technology leader in scanning probe/atomic force
microscopy (AFM/SPM), is offering a Bimodal AFM Tutorial on March 13, 2011 in conjunction with the 3rd
Multifrequency AFM Conference in Madrid, Spain, March 14-15. The Bimodal AFM Tutorial is free of charge to
conference attendees that want to increase their knowledge of multifrequency techniques, including cantilever physics,
materials contrast, bimodal imaging theory, simulation with VEDA, and future directions of the technique. Techniques
will be demonstrated on AFM instrumentation. Guest lecturers include world-renowned researchers in the field:
Arvind Raman of Purdue University, Elena T. Herruzo, Instituto de Microelectrónica de Madrid, CSIC, Garcia Lab, and
Roger Proksch of Asylum Research.
"This tutorial is ideal for the researcher that wants to learn more about materials contrast through multifrequency
techniques," said Roger Proksch, President of Asylum Research. "AFM still faces numerous challenges to bring
together molecular resolution imaging and quantification of material properties. Understanding higher harmonics and
cantilever dynamics is clearly the next evolution of AFM that will take this research to a higher level."
Commented Prof. Ricardo Garcia, Conference Chair, "In 2011 we will commemorate the 25th anniversary of the
invention of the AFM. AFM has become one of the main pillars that sustain the advanced nanoscience and
nanotechnology. However, the AFM still faces challenges to bring together molecular resolution imaging and
quantification of material properties. The need for higher compositional resolution and sensitivity has led to an
evolution from single to multifrequency excitation and detection schemes. The Multifrequency conference and the
Biomodal Tutorial aim to bring together AFM experts and newcomers to share knowledge on the instrumentation and
theoretical aspects of the next generation of advanced force microscopes."
The afternoon tutorial will be held at the Ayre Gran Hotel in Colon, Spain, Multifrequency Conference headquarters.
Registration for the Advanced Tutorial is limited to 15 people and will be based on a first-come, first-served basis.
Additional information and registration can be found on the 3rd Multifrequency AFM Conference web site at
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials
and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative
instrumentation forfor nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our
staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers,
chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding
and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces,
adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples,
including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force
microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is
the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback
sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most
commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard
as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate
images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On™ automated laser and
photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major
AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year
warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee.
We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to
the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our
own MFM and iDrive™ tips.
For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP,
Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-
6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.