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Posted: Feb 22, 2011
New Scanning Probe Microscopy Book Features Articles by Asylum Research Scientists and Customers
(Nanowerk News) The new book, "Scanning Probe Microscopy of Functional Materials", edited by Dr. Sergei Kalinin of the Oak Ridge National Laboratory and Alexei Gruverman of the University of Nebraska, describes cutting-edge nanoscale imaging and spectroscopy advances in the field of atomic force/scanning probe microscopy. The volume includes 18 articles by leading university, U.S. government, and industry researchers, including three authored or co-authored by Dr. Roger Proksch of Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM). Recent research has produced remarkable progress in the development of scanning probe microscopy and this new book is expected to become a seminal work in the field.
Commented author and President of Asylum Research, Roger Proksch, "This new book includes papers on a broad range of new techniques that extend the functionality of SPMs and we think it is an excellent overview for readers interested in quickly getting up to speed on the latest developments. I am delighted to be an author on three of the chapters, which illustrate some of the exciting new capabilities we have incorporated into our MFP-3D™ and Cypher™ AFMs, including Band Excitation, Dual AC Resonance Tracking (DART), Piezoresponse Force Microscopy (PFM), and Ztherm™ modulated thermal analysis."
"SPM has truly become a key characterization tool, not just for selected scientific disciplines, but for the field of nanoscience and technology in general," notes Alexei Gruverman, co-editor of the book and Associate Professor at the University of Nebraska-Lincoln. "This book presents a snapshot of the most advanced modes of this continuously evolving technique describing nanoscale studies of a variety of functional materials such as complex oxides, biopolymers, and semiconductors."
"One of the central tasks of this book is to provide an overview of recent developments in emerging fields of SPM, such as nanoscale thermal analysis, band excitation, chemical imaging using mass-spectrometric detection, as well as exotic combinations of SPM and focused X-ray methods, to name a few," added Sergei Kalinin, co-editor of the book and Senior Staff Member at Oak Ridge Center for Nanophase materials. "The unique aspect of this book is a strong representation of the leading SPM companies with their cutting-edge research and SPM developments that are now becoming available in academic, government, and industrial labs as well as techniques just emerging in leading research labs worldwide."
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On™ automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus, Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.
For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP, Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.