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Posted: May 11, 2011

Asylum Research Announces UK User Meeting and Forum June 21, 2011 in Edinburgh

(Nanowerk News) Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces its 3rd UK User Meeting and Forum to be held June 21 (before the RMS UK SPM Meeting) in Edinburgh, UK. All AFM researchers and Asylum users are invited to share their research with an informative day of technical talks, tutorials, equipment demonstrations and a poster session.
Dr. Chris Mulcahy, Managing Director of Asylum Research UK Ltd. commented, "The User Meeting and Forum is an excellent opportunity to learn what our colleagues are doing in their AFM research. It's also our chance to show them exciting new technical capabilities through the very popular equipment demonstrations which give researchers the chance to ask-the-expert and learn tips and tricks on the AFM. It's an educational, fun day spent with our AFM colleagues and a chance to acknowledge our users that are doing ground-breaking research."
Abstracts are currently being accepted for talks and the poster session. Abstracts can be submitted until May 27, 2011. Prizes will be awarded for the best posters.
A small registration fee of £40 for faculty and £30 for students will be charged to cover teas, lunch and happy hour at the poster session.
About Asylum Research
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM), high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories and application-ready modules.
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On™ automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Source: Asylum Research (press release)
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