(Nanowerk News) LayTec announced their new in-line metrology system PearL at the Intersolar Europe 2011 in Munich.
PearL is part of the LayTec product line for solar applications. It is an optical in-line monitoring system,
measuring photoluminescence spectra of thin-film modules in production lines. The system
is designed for measuring in CIGS based production lines. Photoluminescence spectra allow a fast
detection of the effective Ga content of the absorber during the production process. A product
option for CdTe absorbers is also available.
LayTec's PearL system with 3 measurement heads for center to edge layer characterization.
PearL is LayTec's advanced LASER stimulated spectral photoluminescence (sPL) technology for PV
absorber layer characterization and process control. Differently to integral imaging solutions (iPL)
PearL delivers fast quantitative material parameters based on the spectroscopic response. In a
production environment the continuous recording of the photoluminescence spectra is a highly
valuable measurement for quality control. PearL is a result of intensive R&D work of LayTec's engineers
teaming up with experienced semiconductor scientists. LayTec is now proud to present a
robust metrology solution for controlling the optical band-gap of PV absorber layers in thin-film
CIGS and CdTe in industrial mass production lines.
With PearL LayTec now makes sPL available as an in-line tool. It can be combined with the industry
proven LayTec SolR® that delivers for all solar cell layers tight uniformity control of the film
deposition process from center to edge of each thin-film module.
LayTec develops, manufactures and markets optical in-situ and in-line metrology systems for thin-film processes
with particular focus on compound semiconductor and photovoltaic applications. LayTec's metrology
provides access to all key thin-film parameters in real-time – either during the deposition process or
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