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Posted: Jun 07, 2011

MeX 3D SEM Metrology System Available form Electron Microscopy Sciences

(Nanowerk News) Electron Microscopy Sciences, the premier supplier of equipment for microscopy, is pleased to announce that the MeX scanning electron microscope 3D measurement system is now part of the EMS product line. MeX was developed by Alicona Imaging.
MeX is a standalone software package that turns any SEM with digital imaging into a 3D surface measurement and surface metrology device. Using stereoscopic images the software automatically creates the 3D reconstruction from which the measurement of profile, area, volume and detailed 2D analysis are extracted. MeX can be operated with any SEM requiring only images in common formats. The software is self-installing and works completely independently of any third party drivers or components.
MeX turns any SEM into a 3D measurement device
MeX turns any SEM into a 3D measurement device.
For more information on MeX please visit the Ems web site at
About Alicona Imaging
Alicona Imaging provides innovative measurement solutions in the micro and nano range. The product range of Alicona includes high end optical measurement solutions for the laboratory as well as during production. Key competences are outstanding solutions for the accurate and easy 3D measurement of complex topographies such as geometries with steep flanks and diffuse reflections.
About Electron Microscopy Sciences
Electron Microscopy Sciences is the most comprehensive source for electron microscopy, light microscopy, and histology supplies, chemicals and equipment. EMS is committed to providing the highest quality products along with competitive pricing, prompt delivery, and outstanding customer service.
Source: Electron Microscopy Sciences (press release)
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