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Posted: Jun 20, 2011

Nanotechnology characterization seminars available on free CD

(Nanowerk News) Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has assembled a new collection of its nanotechnology-focused web tutorials and seminars in a convenient CD format.
"Characterizing Nano-Materials and Devices with Precision and Confidence" is available free upon request.
The webinars on the CD are divided between basic and advanced curricula. The basic curriculum includes the following six seminars:
  • How to Get the Most from Your Low Current Measurement Instruments, which describes the basics of low current (from nanoamps to femtoamps) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise.
  • How to Make Electrical Resistivity Measurements of Bulk Materials: Conductors, Insulators, and Semiconductors, which covers the fundamentals of making resistivity measurements on bulk materials.
  • Hall Effect Measurements Fundamentals, which introduces the topic of Hall Effect measurements as it relates to semiconductor materials and device characterization.
  • Give Your Microscope a Hand: Characterization of Nano Structures, which describes the in-situ manipulation techniques that allow the preparation of specific nano-structures such as electronic structures, nano-wires, and nano-tubes for electrical characterization.
  • Understanding Electrical Characterization of Printed and Organic Electronics and Materials, which addresses a novel, unconventional, and potentially game-changing technology that might eventually fundamentally change the field of electronics. Specifically, this seminar presents methods and best practices for the electrical characterization of printed and organic electronics and materials.
  • How to Avoid Self-Heating Effects on Nanoscale Devices, which describes how pulsed electrical testing can reduce the total energy dissipated in a device and thus the potential for damage. In particular, this presentation reviews pulse testing techniques and the equipment needed to meet associated measurement challenges.
  • The advanced curriculum includes four different seminars:
  • Advanced Particle Beam Methods for Nano-characterization and Analysis, which includes case studies on how nanotechnology is progressing from the industrial research environment into product design and development.
  • Electronic Properties of Zinc-Blende Wurtzite Biphasic Gallium Nitride Nanowires and NanoFETs, a seminar that describes how direct two-point and four-point probe measurements of a biphasic gallium nitride nanowire can be conducted using a Zyvex Nanomanipulator coupled with a Keithley 4200-SCS Semiconductor Characterization System.
  • In-situ Correlation of Mechanical Properties, Deformation Behavior, and Electrical Characteristics of Materials Using Conductive Nanoindentation, which addresses the basic conductive nanoindentation technique and also describes the results that can be obtained from relatively mature materials, such as gold, silicon, and metallic glasses as well as the results that can be expected from more advanced materials, such as conductive polymers and conductive metal oxides (ITO).
  • Measurement Needs in Nano-Architectonics, which offers an explanation of why most advances in nanoelectronics have been based on the conventional state variable, electron-charge.
  • Source: Keithley Instruments
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