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Posted: Sep 06, 2011
The University of Texas at Austin and Asylum Research Host an Atomic Force Microscopy Workshop at on September 14-15
(Nanowerk News) Asylum Research, the technology leader in scanning probe/atomic
force microscopy (AFM/SPM), in conjunction with the Center for Nano- and Molecular Science and
Technology (CNM) at the University of Texas at Austin, will be hosting an Atomic Force Microscopy (AFM)
Workshop on September 14-15, 2011.
The workshop will include lectures and equipment/imaging demonstrations/tutorials for both life science applications and electrical characterization of materials. Topics
include force measurements and mapping, Scanning Kelvin Probe Microscopy (SKPM), nanomechanics in
biology, piezoresponse force microscopy (PFM), thermal analysis and high resolution imaging with
Cypher™, the world's fastest and highest resolution AFM. The workshop is open to current AFM researchers
looking to learn more about AFM techniques, as well as those new to AFM that want to learn how AFM can
be used in their own research.
"We are extremely pleased to be teaming with University of Texas at Austin for this workshop," said John
Green, EVP for Asylum Research. "The innovative research coming out of CNM affiliated research groups,
including research to manipulate, analyze and control nanosized materials, and for understanding structure
and reactivity relationships at materials interfaces is truly groundbreaking. Our workshop will also enable
researchers to learn more about the capabilities of advanced AFM instrumentation, as well as to get invaluable
tips for AFM operation."
Dr. Alex Veneman in the Stevenson Research group at UT-Austin preps a sample for Scanning Kelvin Probe Microscopy.
"This is a fantastic opportunity in working with the leading AFM manufacturer to educate and train existing
and new practitioners in emerging AFM techniques and protocols across a broad range of applications," said
Prof. Keith Stevenson, CNM Director. "The development of nanoscience and technology depends strongly
upon our ability to manipulate, analyze and control matter and energy on the atomic and molecular level. The
development of new AFM methods and technology will play a key role in the state-of-the-art probing of
electronic, optical, thermal, mechanical and electromechanical properties of nanostructures and devices."
The first day of the seminar will include lectures from Asylum Research scientists as well as talks on the
current work being done at the University of Texas at Austin. Equipment demonstrations will be done on the
MFP-3D™ and Cypher AFMs. The second day of the workshop will include an overview lecture and
dedicated demonstrations on the Cypher AFM for those interested in high speed, high resolution scanning.
Limited spots are available. A registration fee of $20 will be charged to cover lunch and coffee breaks.
Additional information and registration for the workshop can be found at www.AsylumResearch.com/Events/UTAustin2011/.
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both
materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to innovative
instrumentation for nanoscience and nanotechnology, with over 250 years combined AFM/SPM experience among our
staff. Our instruments are used for a variety of nanoscience applications in material science, physics, polymers,
chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding
and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces,
adhesion, and more. Asylum's product line offers imaging and measurement capabilities for a wide range of samples,
including advanced techniques such as electrical characterization (CAFM, SKPM, EFM), high voltage piezoresponse
force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range of environmental accessories
and application-ready modules.
Asylum's MFP-3D set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-3D is
the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop feedback
sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most
commercially-available inverted optical microscopes.
Asylum's new Cypher AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new
standard as the world's fastest and highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, >20X faster AC imaging for images in minutes instead of
minutes or hours, Spot-On™ automated laser and photodetector alignment for easy setup, integrated thermal, acoustic
and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year
warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction
guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take their
experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus,
Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.
For additional information, contact Terry Mehr, Director of Marketing Communications, or Monteith Heaton, EVP,
Marketing/Business Development, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-
6466x224/227, Terry@AsylumResearch.com, Monte@AsylumResearch.com, www.AsylumResearch.com.