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Posted: Nov 14, 2011
NT-MDT to Host Advanced Atomic Force Microscopy Technology Workshop at 2011 MRS Fall Meeting
(Nanowerk News) NT-MDT will hold a workshop on high resolution visualization and quantitative studies of local surface properties with AFM, topics will include insight on techniques related to Kelvin Force Microscopy (KFM) and dielectric measurements, nanomechanical studies and AFM Confocal Raman. During the workshop different optimization methods will be described and explored to achieve improved sensitivity and spatial resolution.
Dr. Sergei Magonov and Dr. Pavel Dorozhkin of NT-MDT will lead the workshop. Dr. Magonov is renowned in polymer science and scanning probe microscopy, he has 175 peer reviewed papers in these areas of study. Dr. Magonov is currently the head of NT-MDT's U.S. R&D development center. Dr. Dorozhkin is an expert in the field of spectroscopy, has presented at more than 40 global conferences and authored numerous papers. Dr. Dorozhkin is the head of product management and applications at NT-MDT.
The workshop will include lectures and live measurement demonstrations. The demonstrations will cover the measurement advancements described throughout the course of the workshop. The workshop will take place during the Materials Research Society Meeting at the Hynes Convention Center in Boston Massachusetts. The event will be held at the Sheraton Hotel in the Gardner Room at 2:00 PM to 5:00 PM, November 30th, 2011.
More Information about the workshop can be provided by contacting NT-MDT at info(at)ntmdt-america(dot)com, or Nanounity their U.S. distributor at info(at)nanounity(dot)com.
NT-MDT is a leading developer and manufacturer of Atomic Force Microscopes, Scanning Probe Microscopes and instrumentation used in the research and development of various fields of study related to nanotechnology. The company has provided solutions to scientist and engineers for more than 25 years. More information about the company can be found at http://www.ntmdt.com
Nanounity is a sales and distribution company, specializing in nanoscale imaging and analysis instrumentation, servicing and supporting research and engineering at universities, government laboratories, and industrial companies. Product offerings include Atomic Force Microscopes, Scanning Electron Microscopes, Stylus and Optical Surface Profilometers. More information about the company can be found at http://www.nanounity.com.