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Posted: Feb 17, 2012
Asylum Research and the Frederick Seitz Materials Research Laboratory Present The Advanced AFM Workshop
(Nanowerk News) Asylum Research, the technology leader in scanning probe and atomic force
microscopy (SPM/AFM) and the Frederick Seitz Materials Research Laboratory (FSMRL) at the University of
Illinois Urbana Champaign (UIUC), announce The Advanced AFM Workshop on March 21-22, 2012.
will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM),
Piezoresponse Force Microscopy (PFM), multifrequency techniques, new scanning techniques for nanomechanical
characterization, and a tutorial on IGOR Pro software. UIUC researchers will also present current research on PFM,
quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to UIUC
personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM
Jason Cleveland, CEO of Asylum Research, noted, "There are over 200 AFM researchers and students using our
instruments at UIUC's FSMRL. This is an excellent opportunity for us to educate, train, and pass along our
knowledge to both established and up and coming researchers as part of our continuing commitment to support the
scientists of tomorrow. Exciting research is coming out of many departments at UIUC and we're very pleased that
Asylum AFMs have been an important part of their scientific discoveries."
William L. Wilson, Principal Scientist and Director of Central Facilities of the Frederick Seitz Materials Research
Laboratory, notes, "As nanofabrication and nanoscale engineering move to the mainstream, the need for a wide array
of analytical tools is apparent. Scanning probe microscopies like AFM which were once considered exotic research
systems have become workhorse tools. It is extremely important that our user base continue to be conversant with
the industry's newest techniques and technologies. This workshop will provide a unique opportunity for researchers
of all disciplines to learn how these techniques can transform their research."
Added Scott MacLaren, Director of AFM Operations for the MRL, "We are very pleased to be hosting the Advanced
AFM Workshop with Asylum. This is an exceptional opportunity to learn from the experts about advanced AFM
techniques. Our goal is to make this workshop as practical and beneficial as possible for all our researchers."
A small registration fee of $40 will be charged for the workshop for lunches and breaks for both days. Attendees
must register at http://mrl.illinois.edu/AFM2012/. Additional information and can be found at
About Asylum Research
See what our users are saying about Asylum Research at: http://www.asylumresearch.com/References/Testimonials.shtml
Asylum Research is the technology leader in atomic force and scanning probe microscopy (AFM/SPM) for both
materials and bioscience applications. Founded in 1999, we are an employee owned company dedicated to
innovative instrumentation for nanoscience and nanotechnology, with over 300 years combined AFM/SPM
experience among our staff. Our instruments are used for a variety of nanoscience applications in material science,
physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on
DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing,
polymers, colloidal forces, adhesion, and more. Asylum's product line offers imaging and measurement capabilities
for a wide range of samples, including advanced techniques such as electrical characterization (CAFM, KFM, EFM),
high voltage piezoresponse force microscopy (PFM), thermal analysis, quantitative nanoindenting, and a wide range
of environmental accessories and application-ready modules.
Asylum's MFP-3D™ set the standard for AFM technology, with unprecedented precision and flexibility. The MFP-
3D is the first AFM with true independent piezo positioning in all three axes, combined with low noise closed-loop
feedback sensor technology. The MFP-3D offers both top and bottom sample viewing and easy integration with most
commercially-available inverted optical microscopes.
Asylum's new Cypher™ AFM is the world's first new small sample AFM/SPM in over a decade, and sets the new
standard as the world's highest resolution AFM. Cypher provides low-drift closed loop atomic resolution for the
most accurate images and measurements possible today, >20X faster AC imaging with small cantilevers, Spot-On™
automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and
broad support for all major AFM/SPM scanning modes and capabilities.
Asylum Research offers the lowest cost of ownership of any AFM company. Ask us about our industry-best 2-year
warranty, our legendary product and applications support, and our exclusive 6-month money-back satisfaction
guarantee. We are dedicated to providing the most technically advanced AFMs for researchers who want to take
their experiments to the next level. Asylum Research also distributes third party cantilevers from Olympus,
Nanoworld/Nanosensors, and our own MFM and iDrive™ tips.