| Feb 22, 2012 |
On-chip microwave interferometer measures single magnetic nanowire
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(Nanowerk News) Ferromagnetic resonance (FMR) is the main technique for investigating the magnetization dynamics of patterned magnetic structures that are of interest for high-speed memory, magnetic storage, and signal-processing applications.
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The sensitivity of conventional transmission-line-based FMR approaches are either inadequate for single nanoscale magnetic structures or else they introduce background common mode noise.
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In this study (see paper in Review of Scientific Instruments: "Ferromagnetic resonance of a single magnetic nanowire measured with an on-chip microwave interferometer"), an on-chip microwave interferometer suitable for high-sensitivity nanoscale magnetic material characterization was developed by users from Clemson University working collaboratively with the Nanofabrication & Devices Group.
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The device automatically cancels background parasitic common mode noise. The magnetization dynamics of a 240-nm-wide, 5-µm-long, and 70-nm-thick single permalloy nanowire was investigated in particular.
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Full wave three-dimensional simulations show that the device has the capability of studying the fundamental physics of nanoscale magnetic devices.
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