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Posted: Apr 18, 2012
XFlash 6 - The Next Generation of EDS Detectors
(Nanowerk News) At Analytica 2012, Bruker Nano Analytics introduces ΧFlash®6, the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. With the availability of large detector sizes up to 100 mm2, energy resolution down to 121 eV, and throughput up to incredible 600 kcps, the ΧFlash®6 series sets new standards for speed and sensitivity in EDS analysis, and is exceptionally powerful for applications in nano technology and nano research.
With ΧFlash®6, Bruker now offers the widest range of EDS detector sizes in the market, starting from 10 mm2 up to an unequaled 100 mm2, to ensure optimal conditions for any application at any type of electron microscope. Due to the innovative Slim-line design, all detectors of the ΧFlash®6 family provide the largest possible solid angle per active area for maximum collection efficiency, which is especially important at low electron beam currents.
Combined with the unique, most advanced hybrid pulse processing technology, XFlash® 6 detectors can accept input count rates in excess of 1,500 kcps with throughput as high as 600 kcps, and maintain their best energy resolution over the widest range of count rates. With the new detector generation Bruker is pushing the limits of energy resolution again - the premium ΧFlash®6 |10 achieves unmatched 121 eV at Mn-Kα and 38 eV at C-Kα, vital especially for efficient and accurate analysis at low energies.
The ΧFlash®6 user can choose from six different detector models to find the optimal solution for any individual application, no matter whether using SEM, FIB-SEM, µ-probe or TEM. The 10 mm˛ ΧFlash®6 |10 and the 30 mm˛ ΧFlash®6 |30 detectors are well suited for the majority of tasks on SEM, including analysis at high beam current, low kV, and low vacuum. The 60 mm˛ ΧFlash®6 |60 and the 100 mm˛ ΧFlash®6 |100 are particularly useful in low X-ray yield situations, e.g. for low beam current / low kV operation as required for the investigation of nanostructures, or for the analysis of beam-sensitive biological samples. The two detector models for transmission electron microscopy, the 30 mm˛ ΧFlash®6T |30 and the 60 mm˛ ΧFlash®6T |60, are designed to cause minimal mechanical and electromagnetic interference on the TEM, and to guarantee the best take-off angle available.
"Having pioneered the commercial use of SDD about fifteen years ago, we are proud to once again confirm our leadership in X-ray detector technology with today's launch of ΧFlash®." states Thomas Schuelein, President of the Bruker Nano Analytics Division. "Our QUANTAX EDS system, with the new, versatile ΧFlash®6 SDD series and the powerful ESPRIT analytical software suite enables superior analytical performance to the benefit of our clients from academia and industry. We expect to see many exciting results, as ΧFlash®6 will not only make routine EDS analyses much more productive, but will also support solving even the most demanding analytical challenges at the forefront of science."
About Bruker Corporation
Bruker Corporation is a leading provider of high-performance scientific instruments and solutions for molecular and materials research, as well as for industrial and applied analysis. For more information, please visit www.bruker.com.